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LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION OF INSITU BORON-DOPED POLYSILICON
被引:24
作者
:
MARITAN, CM
论文数:
0
引用数:
0
h-index:
0
机构:
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
MARITAN, CM
[
1
]
BERNDT, LP
论文数:
0
引用数:
0
h-index:
0
机构:
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
BERNDT, LP
[
1
]
TARR, NG
论文数:
0
引用数:
0
h-index:
0
机构:
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
TARR, NG
[
1
]
BULLERWELL, JM
论文数:
0
引用数:
0
h-index:
0
机构:
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
BULLERWELL, JM
[
1
]
JENKINS, GM
论文数:
0
引用数:
0
h-index:
0
机构:
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
JENKINS, GM
[
1
]
机构
:
[1]
PROC TECHNOL LTD,OROMOCTO E2V 2H2,NB,CANADA
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1988年
/ 135卷
/ 07期
关键词
:
D O I
:
10.1149/1.2096132
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:1793 / 1796
页数:4
相关论文
共 16 条
[1]
ADAMS AC, 1983, VLSI TECHNOLOGY
[2]
THE LPCVD POLYSILICON PHOSPHORUS DOPED INSITU AS AN INDUSTRIAL-PROCESS
BAUDRANT, A
论文数:
0
引用数:
0
h-index:
0
BAUDRANT, A
SACILOTTI, M
论文数:
0
引用数:
0
h-index:
0
SACILOTTI, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1982,
129
(05)
: 1109
-
1116
[3]
CHARACTERISTICS OF P-DOPED POLYSILICON WITH B2H6 USED AS INSITU DOPANT SOURCE
CHAPPELOW, RE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,DIV SYST PROD,ESSEX JUNCTION,VT 05452
CHAPPELOW, RE
LIN, PT
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,DIV SYST PROD,ESSEX JUNCTION,VT 05452
LIN, PT
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(06)
: 913
-
916
[4]
INFLUENCE OF ASH3, PH3, AND B2H6 ON GROWTH-RATE AND RESISTIVITY OF POLYCRYSTALLINE SILICON FILMS DEPOSITED FROM A SIH4-H2 MIXTURE
EVERSTEY.FC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
EVERSTEY.FC
PUT, BH
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PUT, BH
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(01)
: 106
-
110
[5]
HARBEKE G, 1983, RCA REV, V44, P287
[6]
GROWTH AND PHYSICAL-PROPERTIES OF LPCVD POLYCRYSTALLINE SILICON FILMS
HARBEKE, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
HARBEKE, G
KRAUSBAUER, L
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
KRAUSBAUER, L
STEIGMEIER, EF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
STEIGMEIER, EF
WIDMER, AE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
WIDMER, AE
KAPPERT, HF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
KAPPERT, HF
NEUGEBAUER, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
NEUGEBAUER, G
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(03)
: 675
-
682
[7]
HATALIS MK, 1987, ELECTROCHEMICAL SOC, V871, P378
[8]
HITCHMAN ML, 1979, ELECTROCHEMICAL SOC, P59
[9]
ELECTRICAL CHARACTERISTICS OF BORON DIFFUSED POLYCRYSTALLINE SILICON LAYERS
HORIUCHI, S
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD,CA 94305
STANFORD UNIV,STANFORD,CA 94305
HORIUCHI, S
[J].
SOLID-STATE ELECTRONICS,
1975,
18
(7-8)
: 659
-
665
[10]
DEPOSITION AND ELECTRICAL-PROPERTIES OF INSITU PHOSPHORUS-DOPED SILICON FILMS FORMED BY LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION
LEARN, AJ
论文数:
0
引用数:
0
h-index:
0
LEARN, AJ
FOSTER, DW
论文数:
0
引用数:
0
h-index:
0
FOSTER, DW
[J].
JOURNAL OF APPLIED PHYSICS,
1987,
61
(05)
: 1898
-
1904
←
1
2
→
共 16 条
[1]
ADAMS AC, 1983, VLSI TECHNOLOGY
[2]
THE LPCVD POLYSILICON PHOSPHORUS DOPED INSITU AS AN INDUSTRIAL-PROCESS
BAUDRANT, A
论文数:
0
引用数:
0
h-index:
0
BAUDRANT, A
SACILOTTI, M
论文数:
0
引用数:
0
h-index:
0
SACILOTTI, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1982,
129
(05)
: 1109
-
1116
[3]
CHARACTERISTICS OF P-DOPED POLYSILICON WITH B2H6 USED AS INSITU DOPANT SOURCE
CHAPPELOW, RE
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,DIV SYST PROD,ESSEX JUNCTION,VT 05452
CHAPPELOW, RE
LIN, PT
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,DIV SYST PROD,ESSEX JUNCTION,VT 05452
LIN, PT
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(06)
: 913
-
916
[4]
INFLUENCE OF ASH3, PH3, AND B2H6 ON GROWTH-RATE AND RESISTIVITY OF POLYCRYSTALLINE SILICON FILMS DEPOSITED FROM A SIH4-H2 MIXTURE
EVERSTEY.FC
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
EVERSTEY.FC
PUT, BH
论文数:
0
引用数:
0
h-index:
0
机构:
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PHILIPS RES LABS,EINDHOVEN,NETHERLANDS
PUT, BH
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(01)
: 106
-
110
[5]
HARBEKE G, 1983, RCA REV, V44, P287
[6]
GROWTH AND PHYSICAL-PROPERTIES OF LPCVD POLYCRYSTALLINE SILICON FILMS
HARBEKE, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
HARBEKE, G
KRAUSBAUER, L
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
KRAUSBAUER, L
STEIGMEIER, EF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
STEIGMEIER, EF
WIDMER, AE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
WIDMER, AE
KAPPERT, HF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
KAPPERT, HF
NEUGEBAUER, G
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
UNIV DORTMUND,INST PHYS,D-4600 DORTMUND 50,FED REP GER
NEUGEBAUER, G
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1984,
131
(03)
: 675
-
682
[7]
HATALIS MK, 1987, ELECTROCHEMICAL SOC, V871, P378
[8]
HITCHMAN ML, 1979, ELECTROCHEMICAL SOC, P59
[9]
ELECTRICAL CHARACTERISTICS OF BORON DIFFUSED POLYCRYSTALLINE SILICON LAYERS
HORIUCHI, S
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,STANFORD,CA 94305
STANFORD UNIV,STANFORD,CA 94305
HORIUCHI, S
[J].
SOLID-STATE ELECTRONICS,
1975,
18
(7-8)
: 659
-
665
[10]
DEPOSITION AND ELECTRICAL-PROPERTIES OF INSITU PHOSPHORUS-DOPED SILICON FILMS FORMED BY LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION
LEARN, AJ
论文数:
0
引用数:
0
h-index:
0
LEARN, AJ
FOSTER, DW
论文数:
0
引用数:
0
h-index:
0
FOSTER, DW
[J].
JOURNAL OF APPLIED PHYSICS,
1987,
61
(05)
: 1898
-
1904
←
1
2
→