A COMPUTER METHOD FOR THE CHARACTERIZATION OF SURFACE-LAYER OHMIC CONTACTS

被引：8

作者：

BREZEANU, G ^{[1
]}

CABUZ, C ^{[1
]}

DASCALU, D ^{[1
]}

DAN, PA ^{[1
]}

机构：

[1] IPRS BANEASA,R-72996 BUCHAREST,ROMANIA

来源：

SOLID-STATE ELECTRONICS | 1987年 / 30卷 / 05期

关键词：

D O I：

10.1016/0038-1101(87)90208-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：527 / 532

页数：6

共 23 条

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