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A NEW APPROACH TO THE MODELING OF NONUNIFORMLY DOPED SHORT-CHANNEL MOSFETS
被引:16
作者
:
RATNAM, P
论文数:
0
引用数:
0
h-index:
0
RATNAM, P
SALAMA, CAT
论文数:
0
引用数:
0
h-index:
0
SALAMA, CAT
机构
:
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1984年
/ 31卷
/ 09期
关键词
:
D O I
:
10.1109/T-ED.1984.21702
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1289 / 1298
页数:10
相关论文
共 14 条
[1]
A DYNAMIC AVERAGE MODEL FOR THE BODY EFFECT IN ION-IMPLANTED SHORT CHANNEL (L=1MU-META) MOSFETS
[J].
CHATTERJEE, PK
论文数:
0
引用数:
0
h-index:
0
CHATTERJEE, PK
;
LEISS, JE
论文数:
0
引用数:
0
h-index:
0
LEISS, JE
;
TAYLOR, GW
论文数:
0
引用数:
0
h-index:
0
TAYLOR, GW
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(05)
:606
-607
[2]
MOS DEVICE AND TECHNOLOGY CONSTRAINTS IN VLSI
[J].
ELMANSY, Y
论文数:
0
引用数:
0
h-index:
0
ELMANSY, Y
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
:567
-573
[3]
HOT ELECTRON EFFECTS AND SATURATION VELOCITIES IN SILICON INVERSION LAYERS
[J].
FANG, FF
论文数:
0
引用数:
0
h-index:
0
FANG, FF
;
FOWLER, AB
论文数:
0
引用数:
0
h-index:
0
FOWLER, AB
.
JOURNAL OF APPLIED PHYSICS,
1970,
41
(04)
:1825
-+
[4]
CONDUCTANCE OF MOS TRANSISTORS IN SATURATION
[J].
FROHMANB.D
论文数:
0
引用数:
0
h-index:
0
机构:
Research and Development Laboratory, Fairchild Semiconductor, Palo Alto, Calif.
FROHMANB.D
;
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
机构:
Research and Development Laboratory, Fairchild Semiconductor, Palo Alto, Calif.
GROVE, AS
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1969,
ED16
(01)
:108
-+
[5]
FU KY, 1982, IEEE T ELECTRON DEV, V29, P1810, DOI 10.1109/T-ED.1982.21031
[6]
AN ACCURATE AND SIMPLE MOSFET MODEL FOR COMPUTER-AIDED-DESIGN
[J].
HANAFI, HI
论文数:
0
引用数:
0
h-index:
0
HANAFI, HI
;
CAMNITZ, LH
论文数:
0
引用数:
0
h-index:
0
CAMNITZ, LH
;
DALLY, AJ
论文数:
0
引用数:
0
h-index:
0
DALLY, AJ
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1982,
17
(05)
:882
-891
[7]
V-E DEPENDENCE IN SMALL-SIZED MOS-TRANSISTORS
[J].
LEBURTON, JP
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,RES LABS,MUNICH,FED REP GER
SIEMENS AG,RES LABS,MUNICH,FED REP GER
LEBURTON, JP
;
DORDA, GE
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,RES LABS,MUNICH,FED REP GER
SIEMENS AG,RES LABS,MUNICH,FED REP GER
DORDA, GE
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(08)
:1168
-1171
[8]
A SIMPLE-MODEL OF THE THRESHOLD VOLTAGE OF SHORT AND NARROW CHANNEL MOSFETS
[J].
MERCKEL, G
论文数:
0
引用数:
0
h-index:
0
MERCKEL, G
.
SOLID-STATE ELECTRONICS,
1980,
23
(12)
:1207
-1213
[9]
ACCURATE LARGE-SIGNAL MOS TRANSISTOR MODEL FOR USE IN COMPUTER-AIDED DESIGN
[J].
MERCKEL, G
论文数:
0
引用数:
0
h-index:
0
MERCKEL, G
;
BOREL, J
论文数:
0
引用数:
0
h-index:
0
BOREL, J
;
CUPCEA, NZ
论文数:
0
引用数:
0
h-index:
0
CUPCEA, NZ
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(05)
:681
-+
[10]
ELECTRON-MOBILITY IN SHORT-CHANNEL MOSFETS WITH SERIES RESISTANCES
[J].
RISCH, L
论文数:
0
引用数:
0
h-index:
0
RISCH, L
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(08)
:959
-961
←
1
2
→
共 14 条
[1]
A DYNAMIC AVERAGE MODEL FOR THE BODY EFFECT IN ION-IMPLANTED SHORT CHANNEL (L=1MU-META) MOSFETS
[J].
CHATTERJEE, PK
论文数:
0
引用数:
0
h-index:
0
CHATTERJEE, PK
;
LEISS, JE
论文数:
0
引用数:
0
h-index:
0
LEISS, JE
;
TAYLOR, GW
论文数:
0
引用数:
0
h-index:
0
TAYLOR, GW
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(05)
:606
-607
[2]
MOS DEVICE AND TECHNOLOGY CONSTRAINTS IN VLSI
[J].
ELMANSY, Y
论文数:
0
引用数:
0
h-index:
0
ELMANSY, Y
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(04)
:567
-573
[3]
HOT ELECTRON EFFECTS AND SATURATION VELOCITIES IN SILICON INVERSION LAYERS
[J].
FANG, FF
论文数:
0
引用数:
0
h-index:
0
FANG, FF
;
FOWLER, AB
论文数:
0
引用数:
0
h-index:
0
FOWLER, AB
.
JOURNAL OF APPLIED PHYSICS,
1970,
41
(04)
:1825
-+
[4]
CONDUCTANCE OF MOS TRANSISTORS IN SATURATION
[J].
FROHMANB.D
论文数:
0
引用数:
0
h-index:
0
机构:
Research and Development Laboratory, Fairchild Semiconductor, Palo Alto, Calif.
FROHMANB.D
;
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
机构:
Research and Development Laboratory, Fairchild Semiconductor, Palo Alto, Calif.
GROVE, AS
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1969,
ED16
(01)
:108
-+
[5]
FU KY, 1982, IEEE T ELECTRON DEV, V29, P1810, DOI 10.1109/T-ED.1982.21031
[6]
AN ACCURATE AND SIMPLE MOSFET MODEL FOR COMPUTER-AIDED-DESIGN
[J].
HANAFI, HI
论文数:
0
引用数:
0
h-index:
0
HANAFI, HI
;
CAMNITZ, LH
论文数:
0
引用数:
0
h-index:
0
CAMNITZ, LH
;
DALLY, AJ
论文数:
0
引用数:
0
h-index:
0
DALLY, AJ
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1982,
17
(05)
:882
-891
[7]
V-E DEPENDENCE IN SMALL-SIZED MOS-TRANSISTORS
[J].
LEBURTON, JP
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,RES LABS,MUNICH,FED REP GER
SIEMENS AG,RES LABS,MUNICH,FED REP GER
LEBURTON, JP
;
DORDA, GE
论文数:
0
引用数:
0
h-index:
0
机构:
SIEMENS AG,RES LABS,MUNICH,FED REP GER
SIEMENS AG,RES LABS,MUNICH,FED REP GER
DORDA, GE
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1982,
29
(08)
:1168
-1171
[8]
A SIMPLE-MODEL OF THE THRESHOLD VOLTAGE OF SHORT AND NARROW CHANNEL MOSFETS
[J].
MERCKEL, G
论文数:
0
引用数:
0
h-index:
0
MERCKEL, G
.
SOLID-STATE ELECTRONICS,
1980,
23
(12)
:1207
-1213
[9]
ACCURATE LARGE-SIGNAL MOS TRANSISTOR MODEL FOR USE IN COMPUTER-AIDED DESIGN
[J].
MERCKEL, G
论文数:
0
引用数:
0
h-index:
0
MERCKEL, G
;
BOREL, J
论文数:
0
引用数:
0
h-index:
0
BOREL, J
;
CUPCEA, NZ
论文数:
0
引用数:
0
h-index:
0
CUPCEA, NZ
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1972,
ED19
(05)
:681
-+
[10]
ELECTRON-MOBILITY IN SHORT-CHANNEL MOSFETS WITH SERIES RESISTANCES
[J].
RISCH, L
论文数:
0
引用数:
0
h-index:
0
RISCH, L
.
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(08)
:959
-961
←
1
2
→