ZENER AND AVALANCHE BREAKDOWN IN AS-IMPLANTED LOW-VOLTAGE SI N-P JUNCTIONS

被引：57

作者：

FAIR, RB

WIVELL, HW

机构：

[1] BELL TEL LABS INC,SEMICONDUCTOR DEVICE LAB,READING,PA 19604

[2] BELL TEL LABS INC,TECH STAFF,READING,PA 19604

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1976年 / 23卷 / 05期

关键词：

D O I：

10.1109/T-ED.1976.18438

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：512 / 518

页数：7

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