INVESTIGATION INTO BEHAVIOR OF TRAPPING CENTERS IN MICROPLASMAS

被引：8

作者：

NUTTALL, KI

NIELD, MW

机构：

[1] UNIV LIVERPOOL,DEPT ELECT ENGN & ELECTR,LIVERPOOL L69 3BX,ENGLAND

[2] TEXAS INSTR,BEDFORD,ENGLAND

来源：

SOLID-STATE ELECTRONICS | 1975年 / 18卷 / 01期

关键词：

D O I：

10.1016/0038-1101(75)90067-2

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：13 / 23

页数：11

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