REFLECTANCE ANISOTROPY SPECTROSCOPY - A PROBE FOR SURFACE-CHEMISTRY ON NA2S-PASSIVATED AND (NH4)(2)S-PASSIVATED (001) GAAS

被引:14
作者
PAGET, D [1 ]
BERKOVITS, VL [1 ]
GUSEV, AO [1 ]
机构
[1] AF IOFFE PHYS TECH INST,ST PETERSBURG 194021,RUSSIA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1995年 / 13卷 / 05期
关键词
D O I
10.1116/1.579476
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have investigated the surface optical transitions on (NH4)(2)S-passivated, Na2S-passivated, and unpassivated GaAs as a function of annealing temperature. The change of the reflectance anisotropy (RA) spectrum allows us to distinguish several annealing stages, which we identify as desorption of the protective overlayer, desorption of residual impurities, and breaking of Ga-S bonds. For the case of impurity desorption, we find a very good connection between the increase of dimer concentration, as found from the RA spectrum, with the decrease of impurity concentration, as monitored by Auger spectroscopy. We find significant differences between the Na2S- and the (NH4)(2)S-passivated surfaces. Unlike the Na2S-passivated surface, most of the arsenic atoms situated on the (NH4)(2)S-passivated surface before annealing are found to be dimerized, so that they are not involved in any chemical bonds with the overlying protective layer. Thus, in this last case, As-S bends detected by photoemission spectroscopy are situated in the protective overlayer. (C) 1995 American Vacuum Society.
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页码:2368 / 2377
页数:10
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