SIMS ANALYSIS OF EPILAYERS

被引：12

作者：

HOLLAND, R

BLACKMORE, GW

机构：

来源：

JOURNAL OF CRYSTAL GROWTH | 1984年 / 68卷 / 01期

关键词：

D O I：

10.1016/0022-0248(84)90426-3

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

引用

页码：271 / 281

页数：11

共 28 条

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[8]

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[9] THE QUANTITATIVE APPLICATION OF SIMS TO CADMIUM MERCURY TELLURIDE [J].

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