共 21 条
- [2] AMSEL G, 1964, ANN PHYS-PARIS, V9, P247
- [3] GLANCING ANGLE MEASUREMENTS OF OXYGEN DEPTH PROFILES [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3): : 345 - 348
- [6] CRIDER CA, 1980, ELECTROCHEM SOC P, V80, P135
- [7] GIBBONS JF, 1975, PROJECTED RANGE STAT
- [8] OXYGEN IMPURITY EFFECTS AT METAL-SILICIDE INTERFACES - FORMATION OF SILICON-OXIDE AND SUBOXIDES IN THE NI-SI SYSTEM [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 19 (03): : 641 - 648
- [10] DEPTH PROFILING LIGHT-NUCLEI IN SINGLE-CRYSTALS - A COMBINED NUCLEAR-REACTION AND RBS TECHNIQUE TO MINIMIZE UNWANTED CHANNELING EFFECTS [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1981, 191 (1-3): : 357 - 366