EFFECT OF OXIDIZING AMBIENTS ON PLATINUM SILICIDE FORMATION .2. AUGER AND BACKSCATTERING ANALYSES

被引:48
作者
BLATTNER, RJ
EVANS, CA
LAU, SS
MAYER, JW
ULLRICH, BM
机构
[1] UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
[2] CALTECH,PASADENA,CA 91125
关键词
D O I
10.1149/1.2134120
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
引用
收藏
页码:1732 / 1736
页数:5
相关论文
共 16 条
[1]   ANALYSIS OF SURFACE-LAYERS BY LIGHT ION BACKSCATTERING AND SPUTTERING COMBINED WITH AUGER-ELECTRON SPECTROSCOPY (AES) [J].
BEHRISCH, R ;
SCHERZER, BM ;
STAIB, P .
THIN SOLID FILMS, 1973, 19 (01) :57-67
[2]   CHARACTERIZATION OF SILICON METALLIZATION SYSTEMS USING ENERGETIC ION BACKSCATTERING [J].
BORDERS, JA ;
PICRAUX, ST .
PROCEEDINGS OF THE IEEE, 1974, 62 (09) :1224-1231
[3]  
CHANG CC, 1974, CHARACTERIZATION SOL
[4]   PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS [J].
CHU, WK ;
MAYER, JW ;
NICOLET, MA ;
BUCK, TM ;
AMSEL, G ;
EISEN, F .
THIN SOLID FILMS, 1973, 17 (01) :1-41
[5]   PLATINUM SILICIDE FORMATION - ELECTRON-SPECTROSCOPY OF PLATINUM-PLATINUM SILICIDE INTERFACE [J].
DANYLUK, S ;
MCGUIRE, GE .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (12) :5141-5144
[6]   SEEMAN-BOHLIN X-RAY DIFFRACTOMETER FOR THIN FILMS [J].
FEDER, R ;
BERRY, BS .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1970, 3 (OCT1) :372-&
[7]   EFFECT OF OXIDIZING AMBIENTS ON PLATINUM SILICIDE FORMATION .1. ELECTRON-MICROPROBE ANALYSIS [J].
KINGZETT, TJ ;
LADAS, CA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (12) :1729-1732
[8]   EVALUATION OF GLANCING ANGLE X-RAY-DIFFRACTION AND MEV HE-4 BACKSCATTERING ANALYSES OF SILICIDE FORMATION [J].
LAU, SS ;
CHU, WK ;
MAYER, JW ;
TU, KN .
THIN SOLID FILMS, 1974, 23 (02) :205-213
[9]   ANALYSIS OF THIN-FILM STRUCTURES WITH NUCLEAR BACKSCATTERING AND X-RAY-DIFFRACTION [J].
MAYER, JW ;
TU, KN .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :86-93
[10]   COMPOSITION PROFILES OF CVD PLATINUM AND PLATINUM SILICIDE BY AUGER-ELECTRON SPECTROSCOPY AND SECONDARY ION MASS-SPECTROMETRY [J].
MORABITO, JM ;
RAND, MJ .
THIN SOLID FILMS, 1974, 22 (03) :293-303