QUANTITATIVE EBIC INVESTIGATIONS ON BULK STACKING-FAULTS IN SILICON

被引：5

作者：

KITTLER, M

SCHRODER, KW

BUGIEL, E

BECKER, C

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1984年 / 81卷 / 02期

关键词：

D O I：

10.1002/pssa.2210810249

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K131 / &

共 10 条

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