A maximum DC current gain (beta) of 2.4 x 10(4) and small-signal current gain (h(fe)) of 4.9 x 10(4) were obtained for InGaAs/InP heterojunction bipolar transistors (HBTs) grown by metalorganic chemical vapour deposition (MOCVD). The excellent HBT gain performance is attributed to the exceptional material quality, the good control over p-type dopant diffusion at the base-emitter heterojunction, and the existence of a doping-induced drift field in the base.