THE STRUCTURAL, CHEMICAL AND COMPOSITIONAL NATURE OF AMORPHOUS-SILICON CARBIDE FILMS

被引:38
作者
HICKS, SE [1 ]
FITZGERALD, AG [1 ]
BAKER, SH [1 ]
DINES, TJ [1 ]
机构
[1] UNIV DUNDEE,DEPT CHEM,DUNDEE DD1 4HN,SCOTLAND
来源
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1990年 / 62卷 / 02期
关键词
D O I
10.1080/13642819008226986
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A range of amorphous hydrogenated silicon-carbide films have been produced using the plasma-enhanced chemical-vapour deposition technique with silane and methane diluted in hydrogen as the parent molecules. The air-exposed and sputter- cleaned surfaces of these films have been investigated by means of X-ray photoelectron spectroscopy. Auger electron spectroscopy, secondary-ion mass spectrometry, Raman spectroscopy and reflection-electron diffraction. The structural and chemical nature of the films has been determined as a function of the methane: silane ratio by a combination of the above techniques. X-ray photoelectron spectroscopy and Auger electron spectroscopy have been used to determine the carbon content of the films also as a function of the methane: silane ratio. © 1990 Taylor & Francis Ltd.
引用
收藏
页码:193 / 212
页数:20
相关论文
共 31 条
[11]  
LANNIN JS, 1984, SEMICONDUCT SEMIMET, V21, P159
[12]  
LEE WY, 1980, J APPL PHYS, V51, P6
[13]   ON THE DIFFERENCES BETWEEN A-SIC-H FILMS DEPOSITED WITH AND WITHOUT FLUORINE [J].
MAHAN, AH ;
WILLIAMSON, DL ;
RUTH, M ;
RABOISSON, P .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1985, 77-8 :861-864
[14]   GUIDING PRINCIPLE FOR PREPARING HIGHLY PHOTOSENSITIVE SI-BASED AMORPHOUS-ALLOYS [J].
MATSUDA, A ;
TANAKA, K .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1987, 97-8 :1367-1374
[15]   PLASMA SPECTROSCOPY GLOW-DISCHARGE DEPOSITION OF HYDROGENATED AMORPHOUS-SILICON [J].
MATSUDA, A ;
TANAKA, K .
THIN SOLID FILMS, 1982, 92 (1-2) :171-187
[16]  
MATSUDA A, 1986, J APPL PHYS, V60, P11
[17]   XPS, AES AND FRICTION STUDIES OF SINGLE-CRYSTAL SILICON-CARBIDE [J].
MIYOSHI, K ;
BUCKLEY, DH .
APPLICATIONS OF SURFACE SCIENCE, 1982, 10 (03) :357-376
[18]   COMPUTER-AIDED QUANTIFICATION OF AES AND XPS SPECTRA [J].
MOIR, PA ;
FITZGERALD, AG ;
STOREY, BE .
SURFACE AND INTERFACE ANALYSIS, 1989, 14 (6-7) :295-301
[19]   HIGH-RATE DEPOSITION OF PHOTOSENSITIVE A-SIC-H USING A CARBON SOURCE OF C2H2 [J].
NAKAYAMA, Y ;
AKITA, S ;
NAKANO, M ;
KAWAMURA, T .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1987, 97-8 :1447-1450
[20]  
OREILLY EP, 1985, J NONCRYST SOLIDS, V78, P83