CHARGE CHARACTER OF INTERFACE TRAPS AT THE SI-SIO2 INTERFACE

被引：23

作者：

SHIONO, N

SHIMAYA, M

NAKAJIMA, O

机构：

来源：

APPLIED PHYSICS LETTERS | 1986年 / 48卷 / 17期

关键词：

D O I：

10.1063/1.96446

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1129 / 1131

页数：3

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