INSITU AUGER-ELECTRON SPECTROSCOPY OF CARBON TRANSIENT-BEHAVIOR ON GAAS-SURFACES EXPOSED TO TRIMETHYLGALLIUM

被引:6
作者
GOTO, S
OHNO, H
NOMURA, Y
MORISHITA, Y
WATANABE, A
KATAYAMA, Y
机构
[1] HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN
[2] HOKKAIDO UNIV,DEPT ELECT ENGN,SAPPORO,HOKKAIDO 060,JAPAN
关键词
D O I
10.1016/0022-0248(93)90777-T
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Surface species and its transient behavior on GaAs surfaces exposed to trimethylgallium (TMGa) have been observed directly by in situ Auger electron spectroscopy under the condition where the self-limiting growth of GaAs takes place by chemical beam epitaxy (CBE). After exposure to TMGa, the initial carbon (C) intensity related to alkyls originating from TMGa exponentially decreases with a large time constant (105 s, at 490-degrees-C), eventually reaching a steady state. The dynamic transient of surface reconstruction during this desorption process of the alkyls was observed by reflection high-energy electron diffraction. A modified atomic layer epitaxy growth showed that self-limiting growth occurs on the steady state surface.
引用
收藏
页码:1005 / 1009
页数:5
相关论文
共 16 条
[1]   ATOMIC-LAYER GROWTH OF GAAS BY MODULATED-CONTINUOUS-WAVE LASER METAL-ORGANIC VAPOR-PHASE EPITAXY [J].
AOYAGI, Y ;
DOI, A ;
IWAI, S ;
NAMBA, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (05) :1460-1464
[2]   ATOMIC LAYER EPITAXY OF GAAS BY CHEMICAL BEAM EPITAXY [J].
CHIU, TH ;
CUNNINGHAM, JE ;
ROBERTSON, A ;
MALM, DL .
JOURNAL OF CRYSTAL GROWTH, 1990, 105 (1-4) :155-161
[3]   ATOMIC LAYER EPITAXY OF GALLIUM-ARSENIDE WITH THE USE OF ATOMIC-HYDROGEN [J].
DEKEIJSER, M ;
VANOPDORP, C .
APPLIED PHYSICS LETTERS, 1991, 58 (11) :1187-1189
[4]   EFFECT OF EXPOSURE TO GROUP-III ALKYLS ON COMPOUND SEMICONDUCTOR SURFACES OBSERVED BY X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
ISHII, H ;
OHNO, H ;
MATSUZAKI, K ;
HASEGAWA, H .
JOURNAL OF CRYSTAL GROWTH, 1989, 95 (1-4) :132-135
[5]   ATOMIC LAYER EPITAXY OF GAAS USING GACL3 AND ASH3 [J].
JIN, Y ;
KOBAYASHI, R ;
FUJII, K ;
HASEGAWA, F .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1990, 29 (08) :L1350-L1352
[6]   SIMULATION STUDIES OF A COMPOSITION ANALYSIS BY THICKNESS-FRINGE (CAT) IN AN ELECTRON-MICROSCOPE IMAGE OF GAAS/ALXGA1-XAS SUPERSTRUCTURE [J].
KAKIBAYASHI, H ;
NAGATA, F .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1986, 25 (11) :1644-1649
[7]   PYROLYSIS OF TRIMETHYLGALLIUM ON (001) GAAS SURFACE INVESTIGATED BY SURFACE PHOTOABSORPTION [J].
KOBAYASHI, N ;
HORIKOSHI, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1991, 30 (3A) :L319-L321
[8]   INSITU XPS CHARACTERIZATION OF TRIETHYLGALLIUM EXPOSED GAAS AND ALAS SURFACES [J].
MAEDA, T ;
SAITO, J ;
KONDO, K .
JOURNAL OF CRYSTAL GROWTH, 1990, 105 (1-4) :191-194
[9]   GAAS GROWTH BY ATOMIC LAYER EPITAXY USING DIETHYLGALLIUMCHLORIDE [J].
MORI, K ;
YOSHIDA, M ;
USUI, A ;
TERAO, H .
APPLIED PHYSICS LETTERS, 1988, 52 (01) :27-29
[10]   GALLIUM-ARSENIDE THIN-FILMS BY LOW-TEMPERATURE PHOTOCHEMICAL PROCESSES [J].
NISHIZAWA, J ;
KURABAYASHI, T ;
ABE, H ;
SAKURAI, N .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04) :1572-1577