THERMAL ANNEALING OF RADIATION-DAMAGE IN CMOS ICS IN THE TEMPERATURE RANGE-140-DEGREES-C TO +375-DEGREES-C

被引：6

作者：

DANCHENKO, V

FANG, PH

BRASHEARS, SS

机构：

[1] BOSTON COLL,CHESTNUT HILL,MA 02167

[2] SPACE SCI SERV,LAUREL,MD 20707

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1982年 / 29卷 / 06期

关键词：

D O I：

10.1109/TNS.1982.4336435

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1716 / 1720

页数：5

共 8 条

[1] PREDICTION AND MEASUREMENT OF RADIATION-DAMAGE TO CMOS DEVICES ON BOARD SPACECRAFT [J].

CLIFF, RA ;

DANCHENKO, V ;

STASSINOPOULOS, EG ;

SING, M ;

BRUCKER, GJ ;

OHANIAN, RS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1976, 23 (06) :1781-1788

[2] ACTIVATION-ENERGIES OF THERMAL ANNEALING OF RADIATION-INDUCED DAMAGE IN N-CHANNEL AND P-CHANNEL OF CMOS INTEGRATED-CIRCUITS .2. [J].

DANCHENKO, V ;

FANG, PH ;

BRASHEARS, SS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :4407-4412

[3] DELAYED DARKENING OF RADIATION-EXPOSED RADIOCHROMIC DYE DOSIMETERS [J].

DANCHENKO, V ;

GRIFFIN, GF ;

BRASHEARS, SS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1981, 28 (06) :4156-4160

[4] ACTIVATION-ENERGIES OF THERMAL ANNEALING OF RADIATION-INDUCED DAMAGE IN NORMAL-CHANNELS AND PARA-CHANNELS OF CMOS INTEGRATED-CIRCUITS [J].

DANCHENKO, V ;

STASSINOPOULOS, EG ;

FANG, PH ;

BRASHEARS, SS .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1980, 27 (06) :1658-1664

[5] CMOS HARDNESS PREDICTION FOR LOW-DOSE-RATE ENVIRONMENTS [J].

DERBENWICK, GF ;

SANDER, HH .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1977, 24 (06) :2244-2247

[6] DETERMINING ENERGY-DISTRIBUTION OF PULSE-RADIATION-INDUCED CHARGE IN MOS STRUCTURES FROM RAPID ANNEALING MEASUREMENTS [J].

SIMONS, M ;

HUGHES, HL .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1972, NS19 (06) :282-290

[7] PREDICTION AND MEASUREMENT RESULTS OF RADIATION-DAMAGE TO CMOS DEVICES ON BOARD SPACECRAFT [J].

STASSINOPOULOS, EG ;

DANCHENKO, V ;

CLIFF, RA ;

SING, M .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1977, 24 (06) :2289-2293

[8]

WIGNER EP, 1932, PHYS REV, V210, P749

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