THEORETICAL INVESTIGATIONS OF EXPERIMENTALLY-OBSERVED OPEN-CIRCUIT VOLTAGE-DECAY (OCVD) CURVES

被引：13

作者：

GOPAL, R

DWIVEDI, R

SRIVASTAVA, SK

机构：

来源：

SOLID-STATE ELECTRONICS | 1983年 / 26卷 / 11期

关键词：

D O I：

10.1016/0038-1101(83)90009-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1101 / 1109

页数：9

共 15 条

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