DEPLETION LAYER EFFECTS IN THE OPEN-CIRCUIT-VOLTAGE-DECAY LIFETIME MEASUREMENT

被引：47

作者：

MAHAN, JE

BARNES, DL

机构：

来源：

SOLID-STATE ELECTRONICS | 1981年 / 24卷 / 10期

关键词：

D O I：

10.1016/0038-1101(81)90124-6

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：989 / 994

页数：6

共 12 条

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