HOLE INJECTION AND TRANSPORT IN SIO2-FILMS ON SI

[1] HOLE AND ELECTRON-TRANSPORT IN SIO2-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (10) : 4506 - 4513

[2] IMPACT IONIZATION MODEL FOR DIELECTRIC INSTABILITY AND BREAKDOWN [J]. APPLIED PHYSICS LETTERS, 1974, 25 (12) : 685 - 687

[3] HOLE MOBILITY AND TRANSPORT IN THIN SIO2-FILMS [J]. APPLIED PHYSICS LETTERS, 1975, 26 (08) : 436 - 438

[4] VACUUM ULTRAVIOLET RADIATION EFFECTS IN SIO2 [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1971, NS18 (06) : 99 - +

[5] POWELL RJ, 1975, SPR M EL SOC TOR

[6] MECHANISM OF ELECTRICAL BREAKDOWN IN SIO2-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (03) : 998 - 1007

[7] NATURE OF CONDUCTION AND SWITCHING IN SIO2 [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (05) : 2065 - 2077

[8] SOLOMON P, 1974, THESIS TECHNION ISRA

[9] HOLE CURRENTS IN THERMALLY GROWN SIO2 [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (05) : 2273 - &

[10] DETERMINATION OF SIGN OF CARRIER TRANSPORTED ACROSS SIO2-FILMS ON SI [J]. APPLIED PHYSICS LETTERS, 1974, 25 (01) : 42 - 43

[1] HOLE AND ELECTRON-TRANSPORT IN SIO2-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (10) : 4506 - 4513

[2] IMPACT IONIZATION MODEL FOR DIELECTRIC INSTABILITY AND BREAKDOWN [J]. APPLIED PHYSICS LETTERS, 1974, 25 (12) : 685 - 687

[3] HOLE MOBILITY AND TRANSPORT IN THIN SIO2-FILMS [J]. APPLIED PHYSICS LETTERS, 1975, 26 (08) : 436 - 438

[4] VACUUM ULTRAVIOLET RADIATION EFFECTS IN SIO2 [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1971, NS18 (06) : 99 - +

[5] POWELL RJ, 1975, SPR M EL SOC TOR

[6] MECHANISM OF ELECTRICAL BREAKDOWN IN SIO2-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (03) : 998 - 1007

[7] NATURE OF CONDUCTION AND SWITCHING IN SIO2 [J]. JOURNAL OF APPLIED PHYSICS, 1974, 45 (05) : 2065 - 2077

[8] SOLOMON P, 1974, THESIS TECHNION ISRA

[9] HOLE CURRENTS IN THERMALLY GROWN SIO2 [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (05) : 2273 - &

[10] DETERMINATION OF SIGN OF CARRIER TRANSPORTED ACROSS SIO2-FILMS ON SI [J]. APPLIED PHYSICS LETTERS, 1974, 25 (01) : 42 - 43