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EXTENDED CYCLABILITY IN ELECTRICALLY-ALTERABLE READ-ONLY-MEMORIES
被引:10
作者
:
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, CAMBRIDGE, MA 02139 USA
MIT, CAMBRIDGE, MA 02139 USA
DIMARIA, DJ
[
1
]
DONG, DW
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, CAMBRIDGE, MA 02139 USA
MIT, CAMBRIDGE, MA 02139 USA
DONG, DW
[
1
]
FALCONY, C
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, CAMBRIDGE, MA 02139 USA
MIT, CAMBRIDGE, MA 02139 USA
FALCONY, C
[
1
]
BRORSON, SR
论文数:
0
引用数:
0
h-index:
0
机构:
MIT, CAMBRIDGE, MA 02139 USA
MIT, CAMBRIDGE, MA 02139 USA
BRORSON, SR
[
1
]
机构
:
[1]
MIT, CAMBRIDGE, MA 02139 USA
来源
:
ELECTRON DEVICE LETTERS
|
1982年
/ 3卷
/ 07期
关键词
:
D O I
:
10.1109/EDL.1982.25534
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:191 / 195
页数:5
相关论文
共 15 条
[1]
ELECTRICALLY-ALTERABLE MEMORY USING A DUAL ELECTRON INJECTOR STRUCTURE
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DEMEYER, KM
论文数:
0
引用数:
0
h-index:
0
DEMEYER, KM
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
ELECTRON DEVICE LETTERS,
1980,
1
(09):
: 179
-
181
[2]
CHARGE TRAPPING STUDIES IN SIO2 USING HIGH-CURRENT INJECTION FROM SI-RICH SIO2-FILMS
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
GHEZ, R
论文数:
0
引用数:
0
h-index:
0
GHEZ, R
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(09)
: 4830
-
4841
[3]
ELECTRICALLY-ALTERABLE READ-ONLY-MEMORY USING SI-RICH SIO2 INJECTORS AND A FLOATING POLYCRYSTALLINE SILICON STORAGE LAYER
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DEMEYER, KM
论文数:
0
引用数:
0
h-index:
0
DEMEYER, KM
SERRANO, CM
论文数:
0
引用数:
0
h-index:
0
SERRANO, CM
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
JOURNAL OF APPLIED PHYSICS,
1981,
52
(07)
: 4825
-
4842
[4]
HIGH-CURRENT INJECTION INTO SIO2 FROM SI RICH SIO2-FILMS AND EXPERIMENTAL APPLICATIONS
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(05)
: 2722
-
2735
[5]
DUAL-ELECTRON-INJECTOR-STRUCTURE ELECTRICALLY ALTERABLE READ-ONLY-MEMORY MODELING STUDIES
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DEMEYER, KM
论文数:
0
引用数:
0
h-index:
0
DEMEYER, KM
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(09)
: 1047
-
1053
[6]
STUDY OF CHARGE TRAPPING AS A DEGRADATION MECHANISM IN ELECTRICALLY ALTERABLE READ-ONLY-MEMORIES
FALCONY, C
论文数:
0
引用数:
0
h-index:
0
FALCONY, C
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
DEMEYER, KM
论文数:
0
引用数:
0
h-index:
0
DEMEYER, KM
[J].
JOURNAL OF APPLIED PHYSICS,
1982,
53
(01)
: 43
-
47
[7]
FALCONY C, UNPUB
[8]
THE EFFECTS OF WATER ON OXIDE AND INTERFACE TRAPPED CHARGE GENERATION IN THERMAL SIO2-FILMS
FEIGL, FJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
FEIGL, FJ
YOUNG, DR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
YOUNG, DR
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
DIMARIA, DJ
LAI, S
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
LAI, S
CALISE, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
CALISE, J
[J].
JOURNAL OF APPLIED PHYSICS,
1981,
52
(09)
: 5665
-
5682
[9]
CRYSTALLOGRAPHIC STUDY OF SEMI-INSULATING POLYCRYSTALLINE SILICON (SIPOS) DOPED WITH OXYGEN-ATOMS
HAMASAKI, M
论文数:
0
引用数:
0
h-index:
0
HAMASAKI, M
ADACHI, T
论文数:
0
引用数:
0
h-index:
0
ADACHI, T
WAKAYAMA, S
论文数:
0
引用数:
0
h-index:
0
WAKAYAMA, S
KIKUCHI, M
论文数:
0
引用数:
0
h-index:
0
KIKUCHI, M
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(07)
: 3987
-
3992
[10]
OBSERVATION OF AMORPHOUS-SILICON REGIONS IN SILICON-RICH SILICON DIOXIDE FILMS
HARTSTEIN, A
论文数:
0
引用数:
0
h-index:
0
HARTSTEIN, A
TSANG, JC
论文数:
0
引用数:
0
h-index:
0
TSANG, JC
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
APPLIED PHYSICS LETTERS,
1980,
36
(10)
: 836
-
837
←
1
2
→
共 15 条
[1]
ELECTRICALLY-ALTERABLE MEMORY USING A DUAL ELECTRON INJECTOR STRUCTURE
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DEMEYER, KM
论文数:
0
引用数:
0
h-index:
0
DEMEYER, KM
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
ELECTRON DEVICE LETTERS,
1980,
1
(09):
: 179
-
181
[2]
CHARGE TRAPPING STUDIES IN SIO2 USING HIGH-CURRENT INJECTION FROM SI-RICH SIO2-FILMS
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
GHEZ, R
论文数:
0
引用数:
0
h-index:
0
GHEZ, R
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(09)
: 4830
-
4841
[3]
ELECTRICALLY-ALTERABLE READ-ONLY-MEMORY USING SI-RICH SIO2 INJECTORS AND A FLOATING POLYCRYSTALLINE SILICON STORAGE LAYER
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DEMEYER, KM
论文数:
0
引用数:
0
h-index:
0
DEMEYER, KM
SERRANO, CM
论文数:
0
引用数:
0
h-index:
0
SERRANO, CM
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
JOURNAL OF APPLIED PHYSICS,
1981,
52
(07)
: 4825
-
4842
[4]
HIGH-CURRENT INJECTION INTO SIO2 FROM SI RICH SIO2-FILMS AND EXPERIMENTAL APPLICATIONS
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
JOURNAL OF APPLIED PHYSICS,
1980,
51
(05)
: 2722
-
2735
[5]
DUAL-ELECTRON-INJECTOR-STRUCTURE ELECTRICALLY ALTERABLE READ-ONLY-MEMORY MODELING STUDIES
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DEMEYER, KM
论文数:
0
引用数:
0
h-index:
0
DEMEYER, KM
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(09)
: 1047
-
1053
[6]
STUDY OF CHARGE TRAPPING AS A DEGRADATION MECHANISM IN ELECTRICALLY ALTERABLE READ-ONLY-MEMORIES
FALCONY, C
论文数:
0
引用数:
0
h-index:
0
FALCONY, C
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
DEMEYER, KM
论文数:
0
引用数:
0
h-index:
0
DEMEYER, KM
[J].
JOURNAL OF APPLIED PHYSICS,
1982,
53
(01)
: 43
-
47
[7]
FALCONY C, UNPUB
[8]
THE EFFECTS OF WATER ON OXIDE AND INTERFACE TRAPPED CHARGE GENERATION IN THERMAL SIO2-FILMS
FEIGL, FJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
FEIGL, FJ
YOUNG, DR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
YOUNG, DR
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
DIMARIA, DJ
LAI, S
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
LAI, S
CALISE, J
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
CALISE, J
[J].
JOURNAL OF APPLIED PHYSICS,
1981,
52
(09)
: 5665
-
5682
[9]
CRYSTALLOGRAPHIC STUDY OF SEMI-INSULATING POLYCRYSTALLINE SILICON (SIPOS) DOPED WITH OXYGEN-ATOMS
HAMASAKI, M
论文数:
0
引用数:
0
h-index:
0
HAMASAKI, M
ADACHI, T
论文数:
0
引用数:
0
h-index:
0
ADACHI, T
WAKAYAMA, S
论文数:
0
引用数:
0
h-index:
0
WAKAYAMA, S
KIKUCHI, M
论文数:
0
引用数:
0
h-index:
0
KIKUCHI, M
[J].
JOURNAL OF APPLIED PHYSICS,
1978,
49
(07)
: 3987
-
3992
[10]
OBSERVATION OF AMORPHOUS-SILICON REGIONS IN SILICON-RICH SILICON DIOXIDE FILMS
HARTSTEIN, A
论文数:
0
引用数:
0
h-index:
0
HARTSTEIN, A
TSANG, JC
论文数:
0
引用数:
0
h-index:
0
TSANG, JC
DIMARIA, DJ
论文数:
0
引用数:
0
h-index:
0
DIMARIA, DJ
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
APPLIED PHYSICS LETTERS,
1980,
36
(10)
: 836
-
837
←
1
2
→