RELIABILITY PROBLEMS WITH VLSI

被引：10

作者：

FANTINI, F

机构：

来源：

MICROELECTRONICS RELIABILITY | 1984年 / 24卷 / 02期

关键词：

D O I：

10.1016/0026-2714(84)90452-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：275 / 296

页数：22

共 218 条

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