学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
REVERSE DOPANT REDISTRIBUTION DURING THE INITIAL-STAGES OF THE OXIDATION OF HEAVILY DOPED SILICON IN DRY OXYGEN
被引:7
作者
:
MASSOUD, HZ
论文数:
0
引用数:
0
h-index:
0
MASSOUD, HZ
机构
:
来源
:
APPLIED PHYSICS LETTERS
|
1988年
/ 53卷
/ 06期
关键词
:
D O I
:
10.1063/1.100618
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:497 / 499
页数:3
相关论文
共 19 条
[1]
ANOMALOUS OXIDATION RATE OF SILICON IMPLANTED WITH VERY HIGH-DOSES OF ARSENIC
CHOI, SS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
CHOI, SS
NUMAN, MZ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
NUMAN, MZ
CHU, WK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
CHU, WK
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
IRENE, EA
[J].
APPLIED PHYSICS LETTERS,
1987,
51
(13)
: 1001
-
1003
[2]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[3]
THERMAL OXIDATION OF HEAVILY DOPED SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
SKLAR, M
论文数:
0
引用数:
0
h-index:
0
SKLAR, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1965,
112
(04)
: 430
-
+
[4]
HEAVY-DOPING EFFECTS AND IMPURITY SEGREGATION DURING HIGH-PRESSURE OXIDATION OF SILICON
FUOSS, D
论文数:
0
引用数:
0
h-index:
0
FUOSS, D
TOPICH, JA
论文数:
0
引用数:
0
h-index:
0
TOPICH, JA
[J].
APPLIED PHYSICS LETTERS,
1980,
36
(04)
: 275
-
277
[5]
DESIGN AND OPERATION OF ETA, AN AUTOMATED ELLIPSOMETER
HAUGE, PS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HAUGE, PS
DILL, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
DILL, FH
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1973,
17
(06)
: 472
-
489
[6]
THERMAL-OXIDATION OF HEAVILY PHOSPHORUS-DOPED SILICON
HO, CP
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
HO, CP
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
PLUMMER, JD
MEINDL, JD
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
MEINDL, JD
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
DEAL, BE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(04)
: 665
-
671
[7]
SI-SIO2 INTERFACE OXIDATION-KINETICS - PHYSICAL MODEL FOR THE INFLUENCE OF HIGH SUBSTRATE DOPING LEVELS .2. COMPARISON WITH EXPERIMENT AND DISCUSSION
HO, CP
论文数:
0
引用数:
0
h-index:
0
机构:
Integrated Circuits Laboratory, Stanford University, Stanford
HO, CP
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
机构:
Integrated Circuits Laboratory, Stanford University, Stanford
PLUMMER, JD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(09)
: 1523
-
1530
[8]
SI-SIO2 INTERFACE OXIDATION-KINETICS - PHYSICAL MODEL FOR THE INFLUENCE OF HIGH SUBSTRATE DOPING LEVELS .1. THEORY
HO, CP
论文数:
0
引用数:
0
h-index:
0
机构:
Integrated Circuits Laboratory, Stanford University, Stanford
HO, CP
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
机构:
Integrated Circuits Laboratory, Stanford University, Stanford
PLUMMER, JD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(09)
: 1516
-
1522
[9]
SILICON OXIDATION STUDIES - OXIDATION OF HEAVILY B-DOPED AND P-DOPED SINGLE-CRYSTAL SILICON
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
IRENE, EA
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(07)
: 1146
-
1151
[10]
KERN W, 1970, RCA REV, V31, P187
←
1
2
→
共 19 条
[1]
ANOMALOUS OXIDATION RATE OF SILICON IMPLANTED WITH VERY HIGH-DOSES OF ARSENIC
CHOI, SS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
CHOI, SS
NUMAN, MZ
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
NUMAN, MZ
CHU, WK
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
CHU, WK
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
UNIV N CAROLINA,DEPT CHEM,CHAPEL HILL,NC 27514
IRENE, EA
[J].
APPLIED PHYSICS LETTERS,
1987,
51
(13)
: 1001
-
1003
[2]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[3]
THERMAL OXIDATION OF HEAVILY DOPED SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
SKLAR, M
论文数:
0
引用数:
0
h-index:
0
SKLAR, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1965,
112
(04)
: 430
-
+
[4]
HEAVY-DOPING EFFECTS AND IMPURITY SEGREGATION DURING HIGH-PRESSURE OXIDATION OF SILICON
FUOSS, D
论文数:
0
引用数:
0
h-index:
0
FUOSS, D
TOPICH, JA
论文数:
0
引用数:
0
h-index:
0
TOPICH, JA
[J].
APPLIED PHYSICS LETTERS,
1980,
36
(04)
: 275
-
277
[5]
DESIGN AND OPERATION OF ETA, AN AUTOMATED ELLIPSOMETER
HAUGE, PS
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HAUGE, PS
DILL, FH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
DILL, FH
[J].
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1973,
17
(06)
: 472
-
489
[6]
THERMAL-OXIDATION OF HEAVILY PHOSPHORUS-DOPED SILICON
HO, CP
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
HO, CP
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
PLUMMER, JD
MEINDL, JD
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
MEINDL, JD
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTRUMENT CORP,RES & DEV LAB,PALO ALTO,CA 94304
DEAL, BE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(04)
: 665
-
671
[7]
SI-SIO2 INTERFACE OXIDATION-KINETICS - PHYSICAL MODEL FOR THE INFLUENCE OF HIGH SUBSTRATE DOPING LEVELS .2. COMPARISON WITH EXPERIMENT AND DISCUSSION
HO, CP
论文数:
0
引用数:
0
h-index:
0
机构:
Integrated Circuits Laboratory, Stanford University, Stanford
HO, CP
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
机构:
Integrated Circuits Laboratory, Stanford University, Stanford
PLUMMER, JD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(09)
: 1523
-
1530
[8]
SI-SIO2 INTERFACE OXIDATION-KINETICS - PHYSICAL MODEL FOR THE INFLUENCE OF HIGH SUBSTRATE DOPING LEVELS .1. THEORY
HO, CP
论文数:
0
引用数:
0
h-index:
0
机构:
Integrated Circuits Laboratory, Stanford University, Stanford
HO, CP
PLUMMER, JD
论文数:
0
引用数:
0
h-index:
0
机构:
Integrated Circuits Laboratory, Stanford University, Stanford
PLUMMER, JD
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(09)
: 1516
-
1522
[9]
SILICON OXIDATION STUDIES - OXIDATION OF HEAVILY B-DOPED AND P-DOPED SINGLE-CRYSTAL SILICON
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
IRENE, EA
DONG, DW
论文数:
0
引用数:
0
h-index:
0
DONG, DW
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(07)
: 1146
-
1151
[10]
KERN W, 1970, RCA REV, V31, P187
←
1
2
→