REDUCED PHOTOINDUCED DEGRADATION IN CHEMICAL VAPOR-DEPOSITED HYDROGENATED AMORPHOUS-SILICON FILMS

被引：8

作者：

CHU, TL

CHU, SS

BYLANDER, EG

ANG, ST

机构：

来源：

APPLIED PHYSICS LETTERS | 1988年 / 52卷 / 10期

关键词：

D O I：

10.1063/1.99290

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：807 / 809

页数：3

共 18 条

[1] DEPOSITION AND PHOTOCONDUCTIVITY OF HYDROGENATED AMORPHOUS-SILICON FILMS BY THE PYROLYSIS OF DISILANE [J].

CHU, TL ;

CHU, SS ;

ANG, ST ;

LO, DH ;

DUONG, A ;

HWANG, CG .

JOURNAL OF APPLIED PHYSICS, 1986, 59 (04) :1319-1322

[2] HYDROGENATED AMORPHOUS-SILICON FILMS DEPOSITED IN A HELIUM ATMOSPHERE [J].

CHU, TL ;

CHU, SS ;

ANG, ST ;

DUONG, A ;

HAN, YX ;

LIU, YH .

JOURNAL OF APPLIED PHYSICS, 1986, 60 (12) :4268-4272

[3] ROLE OF CARBON IN HYDROGENATED AMORPHOUS-SILICON SOLAR-CELL DEGRADATION [J].

CRANDALL, RS ;

CARLSON, DE ;

CATALANO, A ;

WEAKLIEM, HA .

APPLIED PHYSICS LETTERS, 1984, 44 (02) :200-201

[4] DEEP ELECTRON TRAPS IN HYDROGENATED AMORPHOUS-SILICON [J].

CRANDALL, RS .

PHYSICAL REVIEW B, 1981, 24 (12) :7457-7459

[5]

CUTRERA M, 1985, PHYS REV B, V31, P100

[6] LIGHT-INDUCED DANGLING BONDS IN HYDROGENATED AMORPHOUS-SILICON [J].

DERSCH, H ;

STUKE, J ;

BEICHLER, J .

APPLIED PHYSICS LETTERS, 1981, 38 (06) :456-458

[7] INVESTIGATION OF SURFACE PASSIVATION OF AMORPHOUS-SILICON USING PHOTOTHERMAL DEFLECTION SPECTROSCOPY [J].

FRYE, RC ;

KUMLER, JJ ;

WONG, CC .

APPLIED PHYSICS LETTERS, 1987, 50 (02) :101-103

[8] HYDROGEN MICROSTRUCTURE IN AMORPHOUS HYDROGENATED SILICON [J].

GLEASON, KK ;

PETRICH, MA ;

REIMER, JA .

PHYSICAL REVIEW B, 1987, 36 (06) :3259-3267

[9] DIRECT MEASUREMENT OF GAP-STATE ABSORPTION IN HYDROGENATED AMORPHOUS-SILICON BY PHOTOTHERMAL DEFLECTION SPECTROSCOPY [J].

JACKSON, WB ;

AMER, NM .

PHYSICAL REVIEW B, 1982, 25 (08) :5559-5562

[10] PHOTOTHERMAL DEFLECTION SPECTROSCOPY AND DETECTION [J].

JACKSON, WB ;

AMER, NM ;

BOCCARA, AC ;

FOURNIER, D .

APPLIED OPTICS, 1981, 20 (08) :1333-1344

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