GALLIUM-VACANCY-DEPENDENT DIFFUSION-MODEL OF OHMIC CONTACTS TO GAAS

被引:25
作者
GUPTA, RP
KHOKLE, WS
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D O I
10.1016/0038-1101(85)90070-X
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
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页码:823 / 830
页数:8
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共 102 条
[61]  
Mukherjee S. D., 1981, Reliability and degradation. Semiconductor devices and circuits, P1
[62]   REACTIONS OF VACUUM-DEPOSITED THIN SCHOTTKY-BARRIER METALLIZATIONS ON GALLIUM-ARSENIDE [J].
MUKHERJEE, SD ;
MORGAN, DV ;
HOWES, MJ ;
SMITH, JG ;
BROOK, P .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02) :138-140
[63]   INTERDIFFUSION AND DEGRADATION OF SI-CR-PT-AG IMPATT DIODE METALLIZATION [J].
MUKHERJEE, SD ;
MORGAN, DV ;
HOWES, MJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (06) :1047-1053
[64]  
MUROKA SP, 1975, J APPL PHYS, V46, P4237
[65]   SUBMICRON SINGLE-GATE AND DUAL-GATE GAAS MESFETS WITH IMPROVED LOW-NOISE AND HIGH-GAIN PERFORMANCE [J].
OGAWA, M ;
OHATA, K ;
FURUTSUKA, T ;
KAWAMURA, N .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1976, 24 (06) :300-305
[66]   LIQUID-PHASE EPITAXIAL-GROWTH OF GAAS FROM AU-GE-NI MELTS [J].
OTSUBO, M ;
KUMABE, H ;
MIKI, H .
SOLID-STATE ELECTRONICS, 1977, 20 (07) :617-621
[67]  
PADAVANI FA, 1966, SOLID ST ELECTRON, V9, P695
[68]  
PADAVANI FA, 1967, SOLID ST ELECTRON, V10, P813
[69]  
PADOVANI FA, 1970, SOLID ST ELECTRON, V13, P1011
[70]   CONTACT-DEGRADATION STUDIES ON GAAS TRANSFERRED-ELECTRON DEVICES USING A FOCUSED BACKSCATTERING TECHNIQUE [J].
PALMSTROM, CJ ;
MORGAN, DV ;
HOWES, MJ .
ELECTRONICS LETTERS, 1977, 13 (17) :504-505