CONSIDERATION ON THE VOID GENERATION MECHANISM IN ELECTRON-BEAM RECRYSTALLIZED SILICON-ON-INSULATOR FILMS

被引:4
作者
HORITA, S [1 ]
ISHIWARA, H [1 ]
机构
[1] TOKYO INST TECHNOL,GRAD SCH SCI & ENGN,YOKOHAMA,KANAGAWA 227,JAPAN
关键词
D O I
10.1063/1.342875
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:2057 / 2063
页数:7
相关论文
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