PIXE IN THE UNIVERSITY AND COMMERCIAL ENVIRONMENTS

被引：4

作者：

BAUMAN, SE ^{[1
]}

NELSON, JW ^{[1
]}

机构：

[1] FLORIDA STATE UNIV,DEPT PEDIAT,TALLAHASSEE,FL 32306

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1985年 / 10-1卷 / MAY期

关键词：

D O I：

10.1016/0168-583X(85)90068-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：621 / 623

页数：3

共 11 条

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[2] PIXE ANALYSIS OF INTERMEDIATE AND THICK TARGETS VIA LINE INTENSITY RATIOS [J].

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HOUMERE, PD ;

NELSON, JW ;

ELDRED, RA ;

CAHILL, TA .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) :203-205

[3] A DEDICATED PIXE ANALYSIS LABORATORY BASED UPON A 4 MV VANDEGRAAFF ACCELERATOR [J].

BAUMAN, S ;

HOUMERE, PD ;

LEONARD, R ;

NELSON, JW .

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[4]

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[5] PROTON MICROPROBES AND PARTICLE-INDUCED X-RAY ANALYTICAL SYSTEMS [J].

CAHILL, TA .

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[6] PIXE ANALYSIS OF THICK TARGETS [J].

CAMPBELL, JL ;

COOKSON, JA .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) :185-197

[7] PROTON-INDUCED X-RAY-EMISSION AS A TOOL FOR TRACE-ELEMENT ANALYSIS [J].

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GAARDE, C ;

HUUS, T ;

KEMP, K .

NUCLEAR INSTRUMENTS & METHODS, 1974, 116 (03) :487-499

[8] ANALYTICAL APPLICATION OF PARTICLE INDUCED X-RAY-EMISSION [J].

JOHANSSON, SAE ;

JOHANSSON, TB .

NUCLEAR INSTRUMENTS & METHODS, 1976, 137 (03) :473-516

[9] THICK TARGET ELEMENTAL ANALYSIS OF ORGANIC AND INORGANIC MATERIALS BY PIXE USING THIN-FILM STANDARDS [J].

KAUFMANN, HC ;

STEENBLIK, J .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) :198-202

[10]

NORMAN L, 1984, NUCL INSTR METH B, V3, P123

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