MICROSCOPIC STRUCTURE OF THE SIO2/SI INTERFACE

被引：1735

作者：

HIMPSEL, FJ ^{[1
]}

MCFEELY, FR ^{[1
]}

TALEBIBRAHIMI, A ^{[1
]}

YARMOFF, JA ^{[1
]}

HOLLINGER, G ^{[1
]}

机构：

[1] ECOLE CENT LYON,ELECTR AUTOMAT & MESURES ELECT LAB,F-69131 ECULLY,FRANCE

来源：

PHYSICAL REVIEW B | 1988年 / 38卷 / 09期

关键词：

D O I：

10.1103/PhysRevB.38.6084

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：6084 / 6096

页数：13

共 93 条

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