A TAMPERED FAILURE RATE MODEL FOR STEP-STRESS ACCELERATED LIFE TEST

被引：169

作者：

BHATTACHARYYA, GK ^{[1
]}

SOEJOETI, Z ^{[1
]}

机构：

[1] GADJAH MADA UNIV,DEPT MATH,JOGJAKARTA,INDONESIA

来源：

COMMUNICATIONS IN STATISTICS-THEORY AND METHODS | 1989年 / 18卷 / 05期

关键词：

D O I：

10.1080/03610928908829990

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

引用

页码：1627 / 1643

页数：17

共 11 条

[1]

ANDERSON JA, 1982, J R STAT SOC C-APPL, V31, P44

[2]

BAIN LJ, 1978, STATISTICAL ANAL REL

[3] STEP-STRESS ACCELERATED LIFE TESTING OF DIODES [J].

BORA, JS .

MICROELECTRONICS AND RELIABILITY, 1979, 19 (03) :279-280

[4]

COX DR, 1972, J R STAT SOC B, V34, P187

[5] BAYESIAN ESTIMATION AND OPTIMAL DESIGNS IN PARTIALLY ACCELERATED LIFE TESTING [J].

DEGROOT, MH ;

GOEL, PK .

NAVAL RESEARCH LOGISTICS, 1979, 26 (02) :223-235

[6] ON TESTING FOR A CONSTANT HAZARD AGAINST A CHANGE-POINT ALTERNATIVE [J].

MATTHEWS, DE ;

FAREWELL, VT .

BIOMETRICS, 1982, 38 (02) :463-468

[7]

MATTHEWS DE, 1985, BIOMETRIKA, V72, P703

[8] OPTIMUM SIMPLE STEP-STRESS PLANS FOR ACCELERATED LIFE TESTING [J].

MILLER, R ;

NELSON, W .

IEEE TRANSACTIONS ON RELIABILITY, 1983, 32 (01) :59-65

[9] ACCELERATED LIFE TESTING - STEP-STRESS MODELS AND DATA ANALYSES [J].

NELSON, W .

IEEE TRANSACTIONS ON RELIABILITY, 1980, 29 (02) :103-108

[10]

NGUYEN HT, 1984, BIOMETRIKA, V71, P299

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