INFLUENCE OF REFILLING EFFECTS ON DEEP-LEVEL TRANSIENT SPECTROSCOPY MEASUREMENTS IN SE-DOPED ALXGA1-XAS

Deep-level transient spectroscopy (DLTS) and constant-capacitance DLTS (CC-DLTS) techniques have been used to investigate selenium-related DX centers in AlGaAs alloys. The value of the thermal activation energy obtained by both techniques was the same (0.21 eV); however, experimental curves show some important differences. While CC-DLTS curves show only one peak, which reveals that there exists only one DX center in Se-doped AlGaAs, in DLTS curves it is possible to resolve up to two peaks lying at a lower temperature than the one observed by CC-DLTS. This disagreement may be due to the fact that DLTS measurements are strongly affected by refilling effects which occur in the edge zone of the space-charge region during capacitance transients performed at constant voltage. These effects accelerate the capacitance transients and can lead to too high thermal-emission rates. In contrast, these effects do not affect CC-DLTS curves, because in constant-capacitance voltage transients the edge of the space-charge region remains unchanged and refilling effects do not take place. These effects are rather important on DX levels because they exhibit thermally activated capture cross sections and very low ionization factors at the experimental temperatures and, therefore, capture processes are slow and their time constants can be similar to those of the emission processes.