REFLECTANCE-DIFFERENCE SPECTROSCOPY - A NEW PROBE OF CRYSTAL-GROWTH BY MBE AND OMCVD

被引：24

作者：

ASPNES, DE

机构：

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1989年 / 25卷 / 05期

关键词：

D O I：

10.1109/3.28000

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1056 / 1063

页数：8

共 45 条

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