INFLUENCE OF SURFACE RECONSTRUCTION ON THE ORIENTATION OF HOMOEPITAXIAL SILICON FILMS

被引:61
作者
HEADRICK, RL
WEIR, BE
BEVK, J
FREER, BS
EAGLESHAM, DJ
FELDMAN, LC
机构
关键词
D O I
10.1103/PhysRevLett.65.1128
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Single-crystal silicon films grown at 400°C on Si(111):B(3 × 3) are rotated 180°about the surface normal with respect to the substrate. We discuss a mechanism based on chemical effects due to the boron (3 × 3) reconstruction that favors the film to grow with a B-type (twin) orientation. Films grown on the Si(111)-(7×7) reconstruction under identical conditions have the A-type (untwinned) orientation. © 1990 The American Physical Society.
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页码:1128 / 1131
页数:4
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