A MODEL FOR PHOSPHORUS SEGREGATION AT THE SILICON SILICON DIOXIDE INTERFACE

被引:80
作者
LAU, F
MADER, L
MAZURE, C
WERNER, C
ORLOWSKI, M
机构
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 1989年 / 49卷 / 06期
关键词
D O I
10.1007/BF00616992
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:671 / 675
页数:5
相关论文
共 14 条
[1]  
Antoniadis D., 1978, SUPREM 2 PROGRAM IC
[2]   IMPURITY REDISTRIBUTION IN SIO2-SI DURING OXIDATION - NUMERICAL-SOLUTION INCLUDING INTERFACIAL FLUXES [J].
ANTONIADIS, DA ;
RODONI, M ;
DUTTON, RW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1979, 126 (11) :1939-1945
[3]  
Beadle W. E., 1985, QUICK REFERENCE MANU, P1
[4]   HREM OF SIP PRECIPITATES AT THE (111) SILICON SURFACE DURING PHOSPHORUS PREDEPOSITION [J].
BOURRET, A ;
SCHROTER, W .
ULTRAMICROSCOPY, 1984, 14 (1-2) :97-106
[5]   QUANTITATIVE MODEL FOR DIFFUSION OF PHOSPHORUS IN SILICON AND EMITTER DIP EFFECT [J].
FAIR, RB ;
TSAI, JCC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (07) :1107-1118
[6]   REDISTRIBUTION OF ACCEPTOR + DONOR IMPURITIES DURING THERMAL OXIDATION OF SILICON [J].
GROVE, AS ;
SAH, CT ;
LEISTIKO, O .
JOURNAL OF APPLIED PHYSICS, 1964, 35 (09) :2695-&
[7]   OBSERVATION OF PHOSPHORUS PILE-UP AT SIO2-SI INTERFACE [J].
JOHANNESSEN, JS ;
SPICER, WE ;
GIBBONS, JF ;
PLUMMER, JD ;
TAYLOR, NJ .
JOURNAL OF APPLIED PHYSICS, 1978, 49 (08) :4453-4458
[8]  
KIM YM, 1985, DX650185 STANF U TEC
[9]  
ORLOWSKI M, UNPUB EXPT PHOSPHORU
[10]   AUGER-SPUTTER PROFILING STUDY OF PHOSPHORUS PILEUP AT SI-SIO2 INTERFACE [J].
SCHWARZ, SA ;
HELMS, CR ;
SPICER, WE ;
TAYLOR, NJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (04) :1519-1519