OBSERVATION OF P-N-JUNCTIONS WITH A FLYING-SPOT SCANNER USING A CHOPPED PHOTON-BEAM

被引：27

作者：

MUNAKATA, C

YAGI, K

WARABISAKO, T

NANBA, M

MATSUBARA, S

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1982年 / 21卷 / 04期

关键词：

D O I：

10.1143/JJAP.21.624

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：624 / 632

页数：9

共 38 条

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[8] LASER SCANNING TECHNIQUE FOR THE DETECTION OF RESISTIVITY AND LIFETIME INHOMOGENEITIES IN SEMICONDUCTOR-DEVICES
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[10] EXAMINATION OF GRAIN-BOUNDARIES IN POLYCRYSTALLINE SOLAR-CELLS USING A SCANNING OPTICAL MICROSCOPE
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[J]. ELECTRONICS LETTERS, 1978, 14 (16) : 507 - 508

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