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THERMAL-OXIDATION OF SILICON IN VARIOUS OXYGEN PARTIAL PRESSURES DILUTED BY NITROGEN
被引:104
作者
:
KAMIGAKI, Y
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN
HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN
KAMIGAKI, Y
[
1
]
ITOH, Y
论文数:
0
引用数:
0
h-index:
0
机构:
HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN
HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN
ITOH, Y
[
1
]
机构
:
[1]
HITACHI LTD,CENT RES LAB,KOKUBUNJI,TOKYO 185,JAPAN
来源
:
JOURNAL OF APPLIED PHYSICS
|
1977年
/ 48卷
/ 07期
关键词
:
D O I
:
10.1063/1.324099
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:2891 / 2896
页数:6
相关论文
共 16 条
[1]
FORMATION OF 20-25A THERMAL OXIDE FILMS ON SILICON AT 950 DEGREES-1140 DEGREES C
ABOAF, JA
论文数:
0
引用数:
0
h-index:
0
ABOAF, JA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(08)
: 1370
-
&
[2]
DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1962,
52
(09)
: 970
-
&
[3]
Cabrera N., 1949, REP PROG PHYS, V12, P308
[4]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[5]
KINETICS OF THERMAL GROWTH OF ULTRA-THIN LAYERS OF SIO2 ON SILICON .2. THEORY
GHEZ, R
论文数:
0
引用数:
0
h-index:
0
GHEZ, R
VANDERME.YJ
论文数:
0
引用数:
0
h-index:
0
VANDERME.YJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(08)
: 1100
-
+
[6]
KINETICS OF THERMAL OXIDATION OF SILICON IN O2-N2 MIXTURES AT 1200 DEGREESC
HESS, DW
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
HESS, DW
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
DEAL, BE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(04)
: 579
-
581
[7]
EFFECTS OF TRACE AMOUNTS OF WATER ON THERMAL OXIDATION OF SILICON IN OXYGEN
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IRENE, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(12)
: 1613
-
1616
[8]
Katto H, 1975, J JPN SOC APPL PHY S, V44, P243
[9]
MCCRACKIN FC, 1964, NBS242 TECH NOT
[10]
KINETICS OF THERMAL GROWTH OF SILICON DIOXIDE FILMS IN WATER VAPOR-OXYGEN-ARGON MIXTURES
NAKAYAMA, T
论文数:
0
引用数:
0
h-index:
0
NAKAYAMA, T
COLLINS, FC
论文数:
0
引用数:
0
h-index:
0
COLLINS, FC
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(07)
: 706
-
+
←
1
2
→
共 16 条
[1]
FORMATION OF 20-25A THERMAL OXIDE FILMS ON SILICON AT 950 DEGREES-1140 DEGREES C
ABOAF, JA
论文数:
0
引用数:
0
h-index:
0
ABOAF, JA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(08)
: 1370
-
&
[2]
DETERMINATION OF PROPERTIES OF FILMS ON SILICON BY METHOD OF ELLIPSOMETRY
ARCHER, RJ
论文数:
0
引用数:
0
h-index:
0
ARCHER, RJ
[J].
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA,
1962,
52
(09)
: 970
-
&
[3]
Cabrera N., 1949, REP PROG PHYS, V12, P308
[4]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
[J].
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
: 3770
-
&
[5]
KINETICS OF THERMAL GROWTH OF ULTRA-THIN LAYERS OF SIO2 ON SILICON .2. THEORY
GHEZ, R
论文数:
0
引用数:
0
h-index:
0
GHEZ, R
VANDERME.YJ
论文数:
0
引用数:
0
h-index:
0
VANDERME.YJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(08)
: 1100
-
+
[6]
KINETICS OF THERMAL OXIDATION OF SILICON IN O2-N2 MIXTURES AT 1200 DEGREESC
HESS, DW
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
HESS, DW
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
FAIRCHILD CAMERA & INSTR CORP,RES & DEV LAB,PALO ALTO,CA 94304
DEAL, BE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1975,
122
(04)
: 579
-
581
[7]
EFFECTS OF TRACE AMOUNTS OF WATER ON THERMAL OXIDATION OF SILICON IN OXYGEN
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, YORKTOWN HTS, NY 10598 USA
IRENE, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(12)
: 1613
-
1616
[8]
Katto H, 1975, J JPN SOC APPL PHY S, V44, P243
[9]
MCCRACKIN FC, 1964, NBS242 TECH NOT
[10]
KINETICS OF THERMAL GROWTH OF SILICON DIOXIDE FILMS IN WATER VAPOR-OXYGEN-ARGON MIXTURES
NAKAYAMA, T
论文数:
0
引用数:
0
h-index:
0
NAKAYAMA, T
COLLINS, FC
论文数:
0
引用数:
0
h-index:
0
COLLINS, FC
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1966,
113
(07)
: 706
-
+
←
1
2
→