CONCEPT OF AN IMAGING XPS SYSTEM

[21] SCANNING AUGER-ELECTRON MICROSCOPY WITH HIGH SPATIAL OR HIGH-ENERGY RESOLUTION [J]. VACUUM, 1982, 32 (06) : 351 - 357

[22] POSITION-SENSITIVE DETECTOR PERFORMANCE AND RELEVANCE TO TIME-RESOLVED ELECTRON-ENERGY LOSS SPECTROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) : 1469 - 1482

[23] HIGH-RESOLUTION X-RAY MICROSCOPY WITH ZONE PLATE MICROSCOPES [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 77 - 81

[24] Seah M. P., 1980, Surface and Interface Analysis, V2, P222, DOI 10.1002/sia.740020607

[25] MEASUREMENT - AES AND XPS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 1330 - 1337

[26] METHOD TO DETERMINE THE ANALYSIS AREA OF X-RAY PHOTOELECTRON SPECTROMETERS ILLUSTRATED BY A PERKIN-ELMER PHI 550 ESCA SAM [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (05) : 703 - 711

[27] SEAH MP, IN PRESS METHODS SUR, pCH3

[28] STECKELMACHER W, 1973, J PHYS E, V6, P1016

[29] COMPUTER OPTIMIZATION OF RETARDING LENS SYSTEMS FOR ESCA SPECTROMETERS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 10 (01) : 45 - 78

[30] SMALL AREA X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. SURFACE AND INTERFACE ANALYSIS, 1983, 5 (05) : 217 - 221

[21] SCANNING AUGER-ELECTRON MICROSCOPY WITH HIGH SPATIAL OR HIGH-ENERGY RESOLUTION [J]. VACUUM, 1982, 32 (06) : 351 - 357

[22] POSITION-SENSITIVE DETECTOR PERFORMANCE AND RELEVANCE TO TIME-RESOLVED ELECTRON-ENERGY LOSS SPECTROSCOPY [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) : 1469 - 1482

[23] HIGH-RESOLUTION X-RAY MICROSCOPY WITH ZONE PLATE MICROSCOPES [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 77 - 81

[24] Seah M. P., 1980, Surface and Interface Analysis, V2, P222, DOI 10.1002/sia.740020607

[25] MEASUREMENT - AES AND XPS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 1330 - 1337

[26] METHOD TO DETERMINE THE ANALYSIS AREA OF X-RAY PHOTOELECTRON SPECTROMETERS ILLUSTRATED BY A PERKIN-ELMER PHI 550 ESCA SAM [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1985, 56 (05) : 703 - 711

[27] SEAH MP, IN PRESS METHODS SUR, pCH3

[28] STECKELMACHER W, 1973, J PHYS E, V6, P1016

[29] COMPUTER OPTIMIZATION OF RETARDING LENS SYSTEMS FOR ESCA SPECTROMETERS [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 10 (01) : 45 - 78

[30] SMALL AREA X-RAY PHOTOELECTRON-SPECTROSCOPY [J]. SURFACE AND INTERFACE ANALYSIS, 1983, 5 (05) : 217 - 221