CONTINUOUS ROUGHNESS CHARACTERIZATION FROM ATOMIC TO MICRON DISTANCES - ANGLE-RESOLVED ELECTRON AND PHOTON SCATTERING

被引：12

作者：

PIETSCH, GJ ^{[1
]}

HENZLER, M ^{[1
]}

HAHN, PO ^{[1
]}

机构：

[1] WACKER CHEMITRON,RES CTR,D-8263 BURGHAUSEN,FED REP GER

来源：

APPLIED SURFACE SCIENCE | 1989年 / 39卷 / 1-4期

关键词：

D O I：

10.1016/0169-4332(89)90462-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：457 / 472

页数：16

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