INTRINSIC GAAS-MESFET EQUIVALENT-CIRCUIT MODELS GENERATED FROM TWO-DIMENSIONAL SIMULATIONS

被引:10
作者
CURTICE, WR [1 ]
机构
[1] MICROWAVE SEMICOND CORP,SOMERSET,NJ 08873
关键词
Electric Networks--Equivalent Circuits - Integrated Circuits; Digital--Computer Aided Design - Integrated Circuits; Monolithic--Microwaves - Mathematical Transformations--Fourier Transforms - Semiconductor Devices--Transients;
D O I
10.1109/43.29593
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
An accurate, physically based two-dimensional GaAs MESFET model is used to generate small-signal and large-signal equivalent circuit models useful for the evaluation of GaAs device structures and GaAs integrated circuits. The models and the simulation techniques described provide a useful means of evaluating RF performance on the basis of the physical properties of the FET. As an example, the small- and large-signal device characteristics are evaluated as a function of drain-source bias voltage and lattice temperature for a 0.8-μm gate length FET. The small-signal results show severe degradation of frequency response with increase of drain-source bias voltage because of a high electric field in the conduction channel. The large-signal results show that the decrease in RF power capability with temperature increase is primarily due to declining current capability with temperature.
引用
收藏
页码:395 / 402
页数:8
相关论文
共 14 条
[1]   SATURATION MECHANISM IN 1-MUM GATE GAAS-FET WITH CHANNEL-SUBSTRATE INTERFACIAL BARRIER [J].
BONJOUR, P ;
CASTAGNE, R ;
PONE, JF ;
COURAT, JP ;
BERT, G ;
NUZILLAT, G ;
PELTIER, M .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1980, 27 (06) :1019-1024
[2]   A NONLINEAR GAAS-FET MODEL FOR USE IN THE DESIGN OF OUTPUT CIRCUITS FOR POWER-AMPLIFIERS [J].
CURTICE, WR ;
ETTENBERG, M .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1985, 33 (12) :1383-1394
[3]   A TEMPERATURE MODEL FOR THE GAAS-MESFET [J].
CURTICE, WR ;
YUN, YH .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (08) :954-962
[4]   THE EFFECT OF DRAIN BIAS UPON FREQUENCY-RESPONSE IN GAAS-MESFETS [J].
CURTICE, WR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (08) :1386-1389
[6]  
CURTICE WR, 1985, RCA REV, V46, P321
[7]   TECHNIQUES FOR SMALL-SIGNAL ANALYSIS OF SEMICONDUCTOR-DEVICES [J].
LAUX, SE .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (10) :2028-2037
[9]   ELECTRON VELOCITY IN SI AND GAAS AT VERY HIGH ELECTRIC-FIELDS [J].
SMITH, PM ;
INOUE, M ;
FREY, J .
APPLIED PHYSICS LETTERS, 1980, 37 (09) :797-798
[10]   TWO-DIMENSIONAL HOT-ELECTRON MODELS FOR SHORT-GATE-LENGTH GAAS-MESFETS [J].
SNOWDEN, CM ;
LORET, D .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (02) :212-223