UNIFORM DOPING OF CHANNELED-ION IMPLANTATION

被引:22
作者
NISHI, H
INADA, T
SAKURAI, T
KANEDA, T
HISATSUGU, T
FURUYA, T
机构
关键词
D O I
10.1063/1.324687
中图分类号
O59 [应用物理学];
学科分类号
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页码:608 / 613
页数:6
相关论文
共 8 条
[1]  
FURUYA T, UNPUBLISHED
[2]   EXCESS NOISE IN SILICON AVALANCHE PHOTODIODES [J].
KANEDA, T ;
MATSUMOTO, H ;
SAKURAI, T ;
YAMAOKA, T .
JOURNAL OF APPLIED PHYSICS, 1976, 47 (04) :1605-1607
[3]   CHANNELING OF BORON IONS INTO SILICON [J].
LECROSNIER, D ;
PAUGAM, J ;
GALLOU, J .
APPLIED PHYSICS LETTERS, 1977, 30 (07) :323-325
[4]  
Lindhard J., 1965, K DAN VIDENSK SELSK, V34, P14
[5]   ION-IMPLANTED PHOSPHOROUS IN SILICON - PROFILES USING C-V ANALYSIS [J].
MOLINE, RA .
JOURNAL OF APPLIED PHYSICS, 1971, 42 (09) :3553-&
[6]   ION-IMPLANTED HYPERABRUPT JUNCTION VOLTAGE VARIABLE CAPACITORS [J].
MOLINE, RA ;
FOXHALL, GF .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1972, ED19 (02) :267-+
[7]   CHANNELING AND DECHANNELING OF ION-IMPLANTED PHOSPHORUS IN SILICON [J].
REDDI, VGK ;
SANSBURY, JD .
JOURNAL OF APPLIED PHYSICS, 1973, 44 (07) :2951-2963
[8]   PLANAR AND AXIAL CHANNELING OF 800-KEV ARSENIC IN [110] SILICON [J].
WILSON, RG .
APPLIED PHYSICS LETTERS, 1976, 29 (12) :770-772