学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
AN INSITU ELLIPSOMETRIC STUDY OF AQUEOUS NH4OH TREATMENT OF SILICON
被引:23
作者
:
GOULD, G
论文数:
0
引用数:
0
h-index:
0
GOULD, G
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
IRENE, EA
机构
:
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1989年
/ 136卷
/ 04期
关键词
:
D O I
:
10.1149/1.2096794
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:1108 / 1112
页数:5
相关论文
共 15 条
[1]
[Anonymous], SEMICONDUCTOR INT
[2]
SPECTROSCOPIC ANALYSIS OF THE INTERFACE BETWEEN SI AND ITS THERMALLY GROWN OXIDE
ASPNES, DE
论文数:
0
引用数:
0
h-index:
0
机构:
LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE
LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE
ASPNES, DE
THEETEN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE
LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE
THEETEN, JB
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1980,
127
(06)
: 1359
-
1365
[3]
Calculation of various physics constants in heterogenous substances I Dielectricity constants and conductivity of mixed bodies from isotropic substances
Bruggeman, DAG
论文数:
0
引用数:
0
h-index:
0
Bruggeman, DAG
[J].
ANNALEN DER PHYSIK,
1935,
24
(07)
: 636
-
664
[4]
EFFECT OF SILICON SURFACE CLEANING PROCEDURES ON OXIDATION-KINETICS AND SURFACE-CHEMISTRY
DELARIOS, JM
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD RES CTR,PALO ALTO,CA 94304
FAIRCHILD RES CTR,PALO ALTO,CA 94304
DELARIOS, JM
HELMS, CR
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD RES CTR,PALO ALTO,CA 94304
FAIRCHILD RES CTR,PALO ALTO,CA 94304
HELMS, CR
KAO, DB
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD RES CTR,PALO ALTO,CA 94304
FAIRCHILD RES CTR,PALO ALTO,CA 94304
KAO, DB
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD RES CTR,PALO ALTO,CA 94304
FAIRCHILD RES CTR,PALO ALTO,CA 94304
DEAL, BE
[J].
APPLIED SURFACE SCIENCE,
1987,
30
(1-4)
: 17
-
24
[5]
ERRORS ARISING FROM SURFACE ROUGHNESS IN ELLIPSOMETRIC MEASUREMENT OF REFRACTIVE INDEX OF A SURFACE
FENSTERMAKER, CA
论文数:
0
引用数:
0
h-index:
0
机构:
Institute for Materials Research, National Bureau of Standards, Washington
FENSTERMAKER, CA
MCCRACKIN, FL
论文数:
0
引用数:
0
h-index:
0
机构:
Institute for Materials Research, National Bureau of Standards, Washington
MCCRACKIN, FL
[J].
SURFACE SCIENCE,
1969,
16
: 85
-
+
[6]
THE INFLUENCE OF SILICON SURFACE CLEANING PROCEDURES ON SILICON OXIDATION
GOULD, G
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of North Carolina, Chapel Hill,, NC, USA, Univ of North Carolina, Chapel Hill, NC, USA
GOULD, G
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of North Carolina, Chapel Hill,, NC, USA, Univ of North Carolina, Chapel Hill, NC, USA
IRENE, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1987,
134
(04)
: 1031
-
1033
[7]
AN INSITU STUDY OF AQUEOUS HF TREATMENT OF SILICON BY CONTACT-ANGLE MEASUREMENT AND ELLIPSOMETRY
GOULD, G
论文数:
0
引用数:
0
h-index:
0
GOULD, G
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
IRENE, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1988,
135
(06)
: 1535
-
1539
[8]
EXPERIMENTAL-OBSERVATIONS OF CHEMISTRY OF SIO2-SI INTERFACE
GRUNTHANER, FJ
论文数:
0
引用数:
0
h-index:
0
GRUNTHANER, FJ
MASERJIAN, J
论文数:
0
引用数:
0
h-index:
0
MASERJIAN, J
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1977,
24
(06)
: 2108
-
2112
[9]
OBSERVATION OF ETCHING OF N-TYPE SILICON IN AQUEOUS HF SOLUTIONS
HU, SM
论文数:
0
引用数:
0
h-index:
0
HU, SM
KERR, DR
论文数:
0
引用数:
0
h-index:
0
KERR, DR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1967,
114
(04)
: 414
-
&
[10]
SURFACE ENERGY OF GERMANIUM AND SILICON
JACCODINE, RJ
论文数:
0
引用数:
0
h-index:
0
JACCODINE, RJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1963,
110
(06)
: 524
-
527
←
1
2
→
共 15 条
[1]
[Anonymous], SEMICONDUCTOR INT
[2]
SPECTROSCOPIC ANALYSIS OF THE INTERFACE BETWEEN SI AND ITS THERMALLY GROWN OXIDE
ASPNES, DE
论文数:
0
引用数:
0
h-index:
0
机构:
LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE
LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE
ASPNES, DE
THEETEN, JB
论文数:
0
引用数:
0
h-index:
0
机构:
LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE
LABS ELECTR & PHYS APPL,F-94450 LIMEIL BREVANNES,FRANCE
THEETEN, JB
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1980,
127
(06)
: 1359
-
1365
[3]
Calculation of various physics constants in heterogenous substances I Dielectricity constants and conductivity of mixed bodies from isotropic substances
Bruggeman, DAG
论文数:
0
引用数:
0
h-index:
0
Bruggeman, DAG
[J].
ANNALEN DER PHYSIK,
1935,
24
(07)
: 636
-
664
[4]
EFFECT OF SILICON SURFACE CLEANING PROCEDURES ON OXIDATION-KINETICS AND SURFACE-CHEMISTRY
DELARIOS, JM
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD RES CTR,PALO ALTO,CA 94304
FAIRCHILD RES CTR,PALO ALTO,CA 94304
DELARIOS, JM
HELMS, CR
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD RES CTR,PALO ALTO,CA 94304
FAIRCHILD RES CTR,PALO ALTO,CA 94304
HELMS, CR
KAO, DB
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD RES CTR,PALO ALTO,CA 94304
FAIRCHILD RES CTR,PALO ALTO,CA 94304
KAO, DB
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
机构:
FAIRCHILD RES CTR,PALO ALTO,CA 94304
FAIRCHILD RES CTR,PALO ALTO,CA 94304
DEAL, BE
[J].
APPLIED SURFACE SCIENCE,
1987,
30
(1-4)
: 17
-
24
[5]
ERRORS ARISING FROM SURFACE ROUGHNESS IN ELLIPSOMETRIC MEASUREMENT OF REFRACTIVE INDEX OF A SURFACE
FENSTERMAKER, CA
论文数:
0
引用数:
0
h-index:
0
机构:
Institute for Materials Research, National Bureau of Standards, Washington
FENSTERMAKER, CA
MCCRACKIN, FL
论文数:
0
引用数:
0
h-index:
0
机构:
Institute for Materials Research, National Bureau of Standards, Washington
MCCRACKIN, FL
[J].
SURFACE SCIENCE,
1969,
16
: 85
-
+
[6]
THE INFLUENCE OF SILICON SURFACE CLEANING PROCEDURES ON SILICON OXIDATION
GOULD, G
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of North Carolina, Chapel Hill,, NC, USA, Univ of North Carolina, Chapel Hill, NC, USA
GOULD, G
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
机构:
Univ of North Carolina, Chapel Hill,, NC, USA, Univ of North Carolina, Chapel Hill, NC, USA
IRENE, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1987,
134
(04)
: 1031
-
1033
[7]
AN INSITU STUDY OF AQUEOUS HF TREATMENT OF SILICON BY CONTACT-ANGLE MEASUREMENT AND ELLIPSOMETRY
GOULD, G
论文数:
0
引用数:
0
h-index:
0
GOULD, G
IRENE, EA
论文数:
0
引用数:
0
h-index:
0
IRENE, EA
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1988,
135
(06)
: 1535
-
1539
[8]
EXPERIMENTAL-OBSERVATIONS OF CHEMISTRY OF SIO2-SI INTERFACE
GRUNTHANER, FJ
论文数:
0
引用数:
0
h-index:
0
GRUNTHANER, FJ
MASERJIAN, J
论文数:
0
引用数:
0
h-index:
0
MASERJIAN, J
[J].
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1977,
24
(06)
: 2108
-
2112
[9]
OBSERVATION OF ETCHING OF N-TYPE SILICON IN AQUEOUS HF SOLUTIONS
HU, SM
论文数:
0
引用数:
0
h-index:
0
HU, SM
KERR, DR
论文数:
0
引用数:
0
h-index:
0
KERR, DR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1967,
114
(04)
: 414
-
&
[10]
SURFACE ENERGY OF GERMANIUM AND SILICON
JACCODINE, RJ
论文数:
0
引用数:
0
h-index:
0
JACCODINE, RJ
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1963,
110
(06)
: 524
-
527
←
1
2
→