ANALYSIS OF TIN BY CHARGED-PARTICLE BEAMS - NUCLEAR-REACTION ANALYSIS, NUCLEAR-REACTION BROADENING AND RUTHERFORD BACKSCATTERING

被引:7
作者
ROTBERG, VH [1 ]
PERRY, AJ [1 ]
STRANDBERG, CC [1 ]
WAS, G [1 ]
机构
[1] GTE VALENITE CORP,TROY,MI 48084
关键词
D O I
10.1016/0040-6090(88)90380-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
29
引用
收藏
页码:191 / 199
页数:9
相关论文
共 28 条
[21]   REACTIVE HIGH-RATE DC SPUTTERING - DEPOSITION RATE, STOICHIOMETRY AND FEATURES OF TIOX AND TINX FILMS WITH RESPECT TO THE TARGET MODE [J].
SCHILLER, S ;
BEISTER, G ;
SIEBER, W .
THIN SOLID FILMS, 1984, 111 (03) :259-268
[22]   PEAK RESOLVING OF COMPLEX AUGER-SPECTRA BY LEAST-SQUARES FITTING WITH PREFILTERING OF SPECTRA - AN APPLICATION TO DEPTH PROFILING [J].
SEKINE, T ;
ANDO, Y ;
TOKUMASU, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1986, 4 (03) :1557-1561
[23]  
SIMPSON JCB, 1986, NUCL INSTRUM METH B, V24, P701
[24]   CRYSTALLINE EFFECTS IN SINGLE-CRYSTAL AND HIGHLY TEXTURED TINX FILMS [J].
STRANDBERG, C ;
PERRY, AJ .
SURFACE AND INTERFACE ANALYSIS, 1988, 12 (1-12) :131-136
[25]  
TOROK E, 1987, THIN SOLID FILMS, V153
[26]  
TOTH LE, 1971, TRANSITION METAL CAR, P88
[27]   THE EFFECT OF NITROGEN-CONTENT ON THE CRITICAL NORMAL FORCE IN SCRATCH TESTING OF TI-N FILMS [J].
VALLI, J ;
MOLARIUS, JM ;
KORHONEN, AS .
THIN SOLID FILMS, 1987, 154 (1-2) :351-360
[28]  
1985, CRC HDB CHEM PHYSICS, pB235