ATOMIC LAYER EPITAXY OF III-V COMPOUNDS USING METALORGANIC AND HYDRIDE SOURCES

被引:40
作者
OZEKI, M
机构
[1] Fujitsu Laboratories Ltd., Atsugi, 243-01
来源
MATERIALS SCIENCE REPORTS | 1992年 / 8卷 / 03期
关键词
D O I
10.1016/0920-2307(92)90008-O
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An overview of atomic layer epitaxy (ALE) for III-V compounds using metalorganic and hydride sources and its possibilities for device fabrication are described. Surface reactions involving the adsorption and desorption processes of source molecules play an important role in the self-limiting growth which is at the very heart of ALE. Various types of ALEs have been developed using metalorganic sources mainly for GaAs growth. Different models have been proposed to explain the self-limiting growth process. Homoepitaxial layers of GaAs, InP, GaP, InAs and lattice-matched ternary alloys all grow in a self-limiting manner. On the other hand, deviations were observed for some lattice-mismatched heteroepitaxial systems, arising from the large strain energy at the heterointerface and the exchange reactions between epitaxial layer atoms and substrate atoms. The growth of (GaAs)m(GaP)n strained-layered superlattices has demonstrated the large potential of ALE in superlattice growth, including monolayer superlattices. The reduction of carbon contamination, which was a serious issue in GaAs ALE, has been achieved and carrier concentrations ranging from 10(14) to 10(20) cm-3 for n-type GaAs and 10(15) to 10(21) cm-3 for p-type GaAs can now be obtained by control of growth conditions and doping levels. ALE offers unique possibilities for low-temperature growth, selective growth, side-wall growth and uniform-thickness growth. The ALE technique is now being applied to the growth of multilayers for high-speed and optoelectronic devices.
引用
收藏
页码:97 / 146
页数:50
相关论文
共 120 条
[81]  
NISHIZAWA J, 1990, ACTA POLYTECH SC CH, P1
[82]  
NISHIZAWA J, 1984, 16 C SOL STAT DEV MA, P1
[83]   PHOTOASSISTED DEPOSITION PROCESS [J].
NISHIZAWA, JI .
THIN SOLID FILMS, 1988, 163 :149-156
[84]   SELF-LIMITING DEPOSITION OF GA ON A GAAS SURFACE BY THERMAL-DECOMPOSITION OF DIETHYLGALLIUMCHLORIDE OBSERVED BY X-RAY PHOTOELECTRON-SPECTROSCOPY [J].
OHNO, H ;
ISHII, H ;
MATSUZAKI, K ;
HASEGAWA, H .
APPLIED PHYSICS LETTERS, 1989, 54 (12) :1124-1126
[85]   ATOMIC LAYER EPITAXY OF GAAS USING TRIETHYLGALLIUM AND ARSINE [J].
OHNO, H ;
OHTSUKA, S ;
ISHII, H ;
MATSUBARA, Y ;
HASEGAWA, H .
APPLIED PHYSICS LETTERS, 1989, 54 (20) :2000-2002
[86]   PHASE-DIAGRAMS OF RHEED INTENSITY OSCILLATIONS ACCOMPANYING THE INCORPORATION OF AS INTO VERY THIN AL FILMS - POSSIBLE MELTING-POINT LOWERING OF THIN AL FILM [J].
OHTA, K ;
KOJIMA, T ;
NAKAGAWA, T .
JOURNAL OF CRYSTAL GROWTH, 1991, 110 (03) :509-515
[87]   A NEW GAAS ON SI STRUCTURE USING ALAS BUFFER LAYERS GROWN BY ATOMIC LAYER EPITAXY [J].
OHTSUKA, N ;
KITAHARA, K ;
OZEKI, M ;
KODAMA, K .
JOURNAL OF CRYSTAL GROWTH, 1990, 99 (1-4) :346-351
[88]   INSITU OBSERVATION OF ROUGHENING PROCESS OF MBE GAAS SURFACE BY SCANNING REFLECTION ELECTRON-MICROSCOPY [J].
OSAKA, J ;
INOUE, N ;
MADA, Y ;
YAMADA, K ;
WADA, K .
JOURNAL OF CRYSTAL GROWTH, 1990, 99 (1-4) :120-123
[89]   GAAS-GAP STRAINED-LAYER SUPERLATTICES GROWN BY ATOMIC LAYER EPITAXY [J].
OZEKI, M ;
KODAMA, K ;
SAKUMA, Y ;
OHTSUKA, N ;
TAKANOHASHI, T .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (04) :741-746
[90]   PULSED JET EPITAXY OF III-V COMPOUNDS [J].
OZEKI, M ;
OHTSUKA, N ;
SAKUMA, Y ;
KODAMA, K .
JOURNAL OF CRYSTAL GROWTH, 1991, 107 (1-4) :102-110