X-RAY PHOTOELECTRON-SPECTROSCOPY STUDIES ON MODIFIED POLYIMIDE SURFACES AFTER ABLATION WITH A KRF EXCIMER LASER

[1] DIRECT ETCHING OF POLYMERIC MATERIALS USING A XECL LASER [J]. APPLIED PHYSICS LETTERS, 1983, 43 (08) : 717 - 719

[2] EXCIMER LASER ETCHING OF POLYIMIDE [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (05) : 2036 - 2043

[3] CLARK DT, 1977, ADV POLYM SCI, V24, P126

[4] EXCIMER LASER ABLATION AND THERMAL COUPLING EFFICIENCY TO POLYMER-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) : 1420 - 1422

[5] CALORIMETRIC AND ACOUSTIC STUDY OF ULTRAVIOLET-LASER ABLATION OF POLYMERS [J]. APPLIED PHYSICS LETTERS, 1985, 46 (09) : 828 - 830

[6] EMISSION-SPECTRA, SURFACE QUALITY, AND MECHANISM OF EXCIMER LASER ETCHING OF POLYIMIDE FILMS [J]. APPLIED PHYSICS LETTERS, 1984, 44 (12) : 1112 - 1114

[7] KOREN G, 1984, J APPL PHYS, V56, P2121

[8] CONTROLLED MODIFICATION OF ORGANIC POLYMER SURFACES BY CONTINUOUS WAVE FAR-ULTRAVIOLET (185NM) AND PULSED-LASER (193NM) RADIATION - XPS STUDIES [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1984, 106 (15) : 4288 - 4290

[9] SURFACE-PROPERTIES OF POLY(ETHYLENE-TEREPHTHALATE) FILMS MODIFIED BY FAR-ULTRAVIOLET RADIATION AT 193-NM (LASER) AND 185-NM (LOW INTENSITY) [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1986, 90 (10) : 2124 - 2131

[10] Leary H. J. Jr., 1979, Surface and Interface Analysis, V1, P75, DOI 10.1002/sia.740010302

[1] DIRECT ETCHING OF POLYMERIC MATERIALS USING A XECL LASER [J]. APPLIED PHYSICS LETTERS, 1983, 43 (08) : 717 - 719

[2] EXCIMER LASER ETCHING OF POLYIMIDE [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (05) : 2036 - 2043

[3] CLARK DT, 1977, ADV POLYM SCI, V24, P126

[4] EXCIMER LASER ABLATION AND THERMAL COUPLING EFFICIENCY TO POLYMER-FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (04) : 1420 - 1422

[5] CALORIMETRIC AND ACOUSTIC STUDY OF ULTRAVIOLET-LASER ABLATION OF POLYMERS [J]. APPLIED PHYSICS LETTERS, 1985, 46 (09) : 828 - 830

[6] EMISSION-SPECTRA, SURFACE QUALITY, AND MECHANISM OF EXCIMER LASER ETCHING OF POLYIMIDE FILMS [J]. APPLIED PHYSICS LETTERS, 1984, 44 (12) : 1112 - 1114

[7] KOREN G, 1984, J APPL PHYS, V56, P2121

[8] CONTROLLED MODIFICATION OF ORGANIC POLYMER SURFACES BY CONTINUOUS WAVE FAR-ULTRAVIOLET (185NM) AND PULSED-LASER (193NM) RADIATION - XPS STUDIES [J]. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY, 1984, 106 (15) : 4288 - 4290

[9] SURFACE-PROPERTIES OF POLY(ETHYLENE-TEREPHTHALATE) FILMS MODIFIED BY FAR-ULTRAVIOLET RADIATION AT 193-NM (LASER) AND 185-NM (LOW INTENSITY) [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1986, 90 (10) : 2124 - 2131

[10] Leary H. J. Jr., 1979, Surface and Interface Analysis, V1, P75, DOI 10.1002/sia.740010302