TITANIUM DISILICIDE FORMATION ON HEAVILY DOPED SILICON SUBSTRATES

被引:107
作者
BEYERS, R [1 ]
COULMAN, D [1 ]
MERCHANT, P [1 ]
机构
[1] HEWLETT PACKARD CO,PALO ALTO,CA 94304
关键词
D O I
10.1063/1.338337
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:5110 / 5117
页数:8
相关论文
共 30 条
  • [1] DEVELOPMENT OF THE SELF-ALIGNED TITANIUM SILICIDE PROCESS FOR VLSI APPLICATIONS
    ALPERIN, ME
    HOLLAWAY, TC
    HAKEN, RA
    GOSMEYER, CD
    KARNAUGH, RV
    PARMANTIE, WD
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1985, 32 (02) : 141 - 149
  • [2] DOPANT REDISTRIBUTION DURING TITANIUM SILICIDE FORMATION
    AMANO, J
    MERCHANT, P
    CASS, TR
    MILLER, JN
    KOCH, T
    [J]. JOURNAL OF APPLIED PHYSICS, 1986, 59 (08) : 2689 - 2693
  • [3] ARSENIC OUT-DIFFUSION DURING TISI2 FORMATION
    AMANO, J
    MERCHANT, P
    KOCH, T
    [J]. APPLIED PHYSICS LETTERS, 1984, 44 (08) : 744 - 746
  • [4] THERMODYNAMIC CONSIDERATIONS IN REFRACTORY METAL-SILICON-OXYGEN SYSTEMS
    BEYERS, R
    [J]. JOURNAL OF APPLIED PHYSICS, 1984, 56 (01) : 147 - 152
  • [5] METASTABLE PHASE FORMATION IN TITANIUM-SILICON THIN-FILMS
    BEYERS, R
    SINCLAIR, R
    [J]. JOURNAL OF APPLIED PHYSICS, 1985, 57 (12) : 5240 - 5245
  • [6] THE PREPARATION OF CROSS-SECTION SPECIMENS FOR TRANSMISSION ELECTRON-MICROSCOPY
    BRAVMAN, JC
    SINCLAIR, R
    [J]. JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1984, 1 (01): : 53 - 61
  • [7] CHEMICAL AND STRUCTURAL ASPECTS OF REACTION AT THE TI SI INTERFACE
    BUTZ, R
    RUBLOFF, GW
    TAN, TY
    HO, PS
    [J]. PHYSICAL REVIEW B, 1984, 30 (10): : 5421 - 5429
  • [8] Chen D.-Y., UNPUB
  • [9] TITANIUM SILICIDE FORMATION ON BF2+-IMPLANTED SILICON
    CHOW, TP
    KATZ, W
    SMITH, G
    [J]. APPLIED PHYSICS LETTERS, 1985, 46 (01) : 41 - 43
  • [10] TITANIUM SILICIDE FORMATION ON BORON-IMPLANTED SILICON
    CHOW, TP
    KATZ, W
    GOEHNER, R
    SMITH, G
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1985, 132 (08) : 1914 - 1918