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BORON REDISTRIBUTION IN SINTERED ALPHA-SIC DURING THERMAL-OXIDATION
被引:19
作者
:
COSTELLO, JA
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
COSTELLO, JA
[
1
]
TRESSLER, RE
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
TRESSLER, RE
[
1
]
TSONG, IST
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
TSONG, IST
[
1
]
机构
:
[1]
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
来源
:
JOURNAL OF THE AMERICAN CERAMIC SOCIETY
|
1981年
/ 64卷
/ 06期
关键词
:
D O I
:
10.1111/j.1151-2916.1981.tb10298.x
中图分类号
:
TQ174 [陶瓷工业];
TB3 [工程材料学];
学科分类号
:
0805 ;
080502 ;
摘要
:
引用
收藏
页码:332 / 335
页数:4
相关论文
共 17 条
[1]
MODELS FOR COMPUTER-SIMULATION OF COMPLETE IC FABRICATION PROCESS
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
ANTONIADIS, DA
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
DUTTON, RW
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(04)
: 490
-
500
[2]
BORON SEGREGATION AT SI-SIO2 INTERFACE AS A FUNCTION OF TEMPERATURE AND ORIENTATION
COLBY, JW
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,ALLENTOWN,PA 18103
BELL TEL LABS INC,ALLENTOWN,PA 18103
COLBY, JW
KATZ, LE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,ALLENTOWN,PA 18103
BELL TEL LABS INC,ALLENTOWN,PA 18103
KATZ, LE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(03)
: 409
-
412
[3]
OXIDATION-KINETICS OF HOT-PRESSED AND SINTERED ALPHA-SIC
COSTELLO, JA
论文数:
0
引用数:
0
h-index:
0
COSTELLO, JA
TRESSLER, RE
论文数:
0
引用数:
0
h-index:
0
TRESSLER, RE
[J].
JOURNAL OF THE AMERICAN CERAMIC SOCIETY,
1981,
64
(06)
: 327
-
331
[4]
KINETICS OF OXIDATION OF HOT-PRESSED SILICON-NITRIDE CONTAINING MAGNESIA
CUBICCIOTTI, D
论文数:
0
引用数:
0
h-index:
0
CUBICCIOTTI, D
LAU, KH
论文数:
0
引用数:
0
h-index:
0
LAU, KH
[J].
JOURNAL OF THE AMERICAN CERAMIC SOCIETY,
1978,
61
(11-1)
: 512
-
517
[5]
THERMAL OXIDATION OF HEAVILY DOPED SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
SKLAR, M
论文数:
0
引用数:
0
h-index:
0
SKLAR, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1965,
112
(04)
: 430
-
+
[6]
THEORY AND DIRECT MEASUREMENT OF BORON SEGREGATION IN SIO2 DURING DRY, NEAR DRY, AND WET O2 OXIDATION
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
FAIR, RB
TSAI, JCC
论文数:
0
引用数:
0
h-index:
0
TSAI, JCC
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(12)
: 2050
-
2058
[7]
DIFFUSIVITY SUMMARY OF B, GA, P, AS, AND SB IN SIO2
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GHEZZO, M
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
BROWN, DM
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(01)
: 146
-
148
[8]
REDISTRIBUTION OF ACCEPTOR + DONOR IMPURITIES DURING THERMAL OXIDATION OF SILICON
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
LEISTIKO, O
论文数:
0
引用数:
0
h-index:
0
LEISTIKO, O
[J].
JOURNAL OF APPLIED PHYSICS,
1964,
35
(09)
: 2695
-
&
[9]
ANALYTIC CORRECTION OF EDGE EFFECTS IN ION-BEAM SPUTTERED DEPTH PROFILES
HOFFMAN, DW
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
HOFFMAN, DW
TSONG, IST
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
TSONG, IST
POWER, GL
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
POWER, GL
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1980,
17
(02):
: 613
-
620
[10]
IMPURITY REDISTRIBUTION DURING SILICON EPITAXIAL-GROWTH AND SEMICONDUCTOR-DEVICE PROCESSING
LANGER, PH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
LANGER, PH
GOLDSTEIN, JI
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
GOLDSTEIN, JI
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(04)
: 563
-
571
←
1
2
→
共 17 条
[1]
MODELS FOR COMPUTER-SIMULATION OF COMPLETE IC FABRICATION PROCESS
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
ANTONIADIS, DA
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
DUTTON, RW
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1979,
26
(04)
: 490
-
500
[2]
BORON SEGREGATION AT SI-SIO2 INTERFACE AS A FUNCTION OF TEMPERATURE AND ORIENTATION
COLBY, JW
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,ALLENTOWN,PA 18103
BELL TEL LABS INC,ALLENTOWN,PA 18103
COLBY, JW
KATZ, LE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,ALLENTOWN,PA 18103
BELL TEL LABS INC,ALLENTOWN,PA 18103
KATZ, LE
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(03)
: 409
-
412
[3]
OXIDATION-KINETICS OF HOT-PRESSED AND SINTERED ALPHA-SIC
COSTELLO, JA
论文数:
0
引用数:
0
h-index:
0
COSTELLO, JA
TRESSLER, RE
论文数:
0
引用数:
0
h-index:
0
TRESSLER, RE
[J].
JOURNAL OF THE AMERICAN CERAMIC SOCIETY,
1981,
64
(06)
: 327
-
331
[4]
KINETICS OF OXIDATION OF HOT-PRESSED SILICON-NITRIDE CONTAINING MAGNESIA
CUBICCIOTTI, D
论文数:
0
引用数:
0
h-index:
0
CUBICCIOTTI, D
LAU, KH
论文数:
0
引用数:
0
h-index:
0
LAU, KH
[J].
JOURNAL OF THE AMERICAN CERAMIC SOCIETY,
1978,
61
(11-1)
: 512
-
517
[5]
THERMAL OXIDATION OF HEAVILY DOPED SILICON
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
SKLAR, M
论文数:
0
引用数:
0
h-index:
0
SKLAR, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1965,
112
(04)
: 430
-
+
[6]
THEORY AND DIRECT MEASUREMENT OF BORON SEGREGATION IN SIO2 DURING DRY, NEAR DRY, AND WET O2 OXIDATION
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
FAIR, RB
TSAI, JCC
论文数:
0
引用数:
0
h-index:
0
TSAI, JCC
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(12)
: 2050
-
2058
[7]
DIFFUSIVITY SUMMARY OF B, GA, P, AS, AND SB IN SIO2
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GHEZZO, M
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
BROWN, DM
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(01)
: 146
-
148
[8]
REDISTRIBUTION OF ACCEPTOR + DONOR IMPURITIES DURING THERMAL OXIDATION OF SILICON
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
LEISTIKO, O
论文数:
0
引用数:
0
h-index:
0
LEISTIKO, O
[J].
JOURNAL OF APPLIED PHYSICS,
1964,
35
(09)
: 2695
-
&
[9]
ANALYTIC CORRECTION OF EDGE EFFECTS IN ION-BEAM SPUTTERED DEPTH PROFILES
HOFFMAN, DW
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
HOFFMAN, DW
TSONG, IST
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
TSONG, IST
POWER, GL
论文数:
0
引用数:
0
h-index:
0
机构:
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
PENN STATE UNIV,MAT RES LAB,UNIVERSITY PK,PA 16802
POWER, GL
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1980,
17
(02):
: 613
-
620
[10]
IMPURITY REDISTRIBUTION DURING SILICON EPITAXIAL-GROWTH AND SEMICONDUCTOR-DEVICE PROCESSING
LANGER, PH
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
LANGER, PH
GOLDSTEIN, JI
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
GOLDSTEIN, JI
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1974,
121
(04)
: 563
-
571
←
1
2
→