ANODICALLY GROWN POROUS SILICON STRUCTURE - FORMATION MECHANISMS

被引:7
作者
SOARES, DM
DOSSANTOS, MC
TESCHKE, O
机构
[1] Instituto de Física, Universidade Estadual de Campinas, 13081-970 Campinas, SP
基金
巴西圣保罗研究基金会;
关键词
D O I
10.1016/0009-2614(95)00700-E
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
It is experimentally shown, in porous silicon formation, that there is an increase in dissolution rate at fluorine-covered sites of the silicon surface due to the presence of excess electrons coming from the oxidation of molecular hydrogen at hydrogen-covered sites. The increase in dissolution rate in the presence of excess charge at the fluorine-covered sites is investigated theoretically by a semi-empirical Hartree-Fock calculation which shows that this spatially variable dissolution generates the porous silicon structure.
引用
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页码:202 / 206
页数:5
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