PREPARATION OF HIGH-QUALITY N-TYPE POLY-SI FILMS BY THE SOLID-PHASE CRYSTALLIZATION (SPC) METHOD

被引:55
作者
MATSUYAMA, T
WAKISAKA, K
KAMEDA, M
TANAKA, M
MATSUOKA, T
TSUDA, S
NAKANO, S
KISHI, Y
KUWANO, Y
机构
[1] Functional Materials Research Center, Sanyo Electric Co. Ltd., Hirakata City, Osaka
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1990年 / 29卷 / 11期
关键词
SOLID PHASE CRYSTALLIZATION (SPC); POLYCRYSTALLINE SILICON (POLY-SI); SCANNING ELECTRON MICROSCOPY (SEM); MINORITY CARRIER TRAP DENSITY; PARTIAL DOPING; BULK DOPING; SOLAR CELL; COLLECTION EFFICIENCY;
D O I
10.1143/JJAP.29.2327
中图分类号
O59 [应用物理学];
学科分类号
摘要
For further improvement of conversion efficiency in a-Si solar cells, it is necessary to develop materials with high photosensitivity in the long-wavelength region. A new solid phase crystallization (SPC) method was developed to grow a Si crystal at temperatures as low as 600-degrees-C. Using this method, high-quality thin-film polycrystalline silicon (poly-Si) with a Hall mobility of 70 cm2/V.s was obtained. Quantum efficiency in the range of 800 nm approximately 1000 nm was achieved up to 80% in an experimental solar cell using the n-type poly-Si with a grain size of about 1.5 mu-m. Therefore, it was found that our SPC method was suitable as a new technique to prepare high-quality solar cell materials.
引用
收藏
页码:2327 / 2331
页数:5
相关论文
共 11 条
[1]  
BARNETT AM, 1989, 4TH INT PHOT SCI ENG, P151
[2]  
KOBAYASHI T, 1988, 20 CSSDM, P57
[3]   DEPOSITION AND ELECTRICAL-PROPERTIES OF INSITU PHOSPHORUS-DOPED SILICON FILMS FORMED BY LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION [J].
LEARN, AJ ;
FOSTER, DW .
JOURNAL OF APPLIED PHYSICS, 1987, 61 (05) :1898-1904
[4]   PHOSPHORUS-DOPED POLYCRYSTALLINE SILICON VIA LPCVD .1. PROCESS CHARACTERIZATION [J].
MEYERSON, BS ;
OLBRICHT, W .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1984, 131 (10) :2361-2365
[5]   DRIFT MOBILITIES IN SEMICONDUCTORS .1. GERMANIUM [J].
PRINCE, MB .
PHYSICAL REVIEW, 1953, 92 (03) :681-687
[6]   CONDUCTION MECHANISM OF HIGH-RESISTIVITY POLYCRYSTALLINE SILICON FILMS [J].
SAITO, Y ;
MIZUSHIMA, I ;
KUWANO, H .
JOURNAL OF APPLIED PHYSICS, 1985, 57 (06) :2010-2013
[7]   XECL EXCIMER LASER ANNEALING USED TO FABRICATE POLY-SI TFTS [J].
SAMESHIMA, T ;
HARA, M ;
USUI, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (10) :1789-1793
[8]   ELECTRICAL PROPERTIES OF POLYCRYSTALLINE SILICON FILMS [J].
SETO, JYW .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (12) :5247-5254
[9]   RESISTIVITY MOBILITY AND IMPURITY LEVELS IN GAAS GE AND SI AT 300 DEGREES K [J].
SZE, SM ;
IRVIN, JC .
SOLID-STATE ELECTRONICS, 1968, 11 (06) :599-&
[10]  
TAKAKURA H, 1989, 4TH P INT PHOT SCI E, P403