SECONDARY ION EMISSION AND SPUTTER YIELDS FROM METAL TARGETS UNDER F2+ BOMBARDMENT

被引：11

作者：

REUTER, W

CLABES, JG

机构：

来源：

ANALYTICAL CHEMISTRY | 1988年 / 60卷 / 14期

关键词：

D O I：

10.1021/ac00165a012

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1404 / 1408

页数：5

共 18 条

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