学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
ETCH RATES OF DOPED OXIDES IN SOLUTIONS OF BUFFERED HF
被引:49
作者
:
TENNEY, AS
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
TENNEY, AS
[
1
]
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GHEZZO, M
[
1
]
机构
:
[1]
GE,CORP RES & DEV,SCHENECTADY,NY 12301
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1973年
/ 120卷
/ 08期
关键词
:
D O I
:
10.1149/1.2403636
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:1091 / 1095
页数:5
相关论文
共 30 条
[1]
STRUCTUAL CHANGES OF ARSENIC SILICATE GLASSES WITH HEAT TREATMENTS
ARAI, E
论文数:
0
引用数:
0
h-index:
0
ARAI, E
TERUNUMA, Y
论文数:
0
引用数:
0
h-index:
0
TERUNUMA, Y
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1970,
9
(06)
: 691
-
+
[2]
GLASS SOURCE B DIFFUSION IN SI AND SIO2
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
BROWN, DM
KENNICOTT, PR
论文数:
0
引用数:
0
h-index:
0
KENNICOTT, PR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(02)
: 293
-
+
[3]
BUSEN KM, 1968, ELECTROCHEM TECHNOL, V6, P256
[4]
ELLIPSOMETRIC INVESTIGATIONS OF BORON-RICH LAYERS ON SILICON
BUSEN, KM
论文数:
0
引用数:
0
h-index:
0
BUSEN, KM
FITZGIBBONS, WA
论文数:
0
引用数:
0
h-index:
0
FITZGIBBONS, WA
TSANG, WK
论文数:
0
引用数:
0
h-index:
0
TSANG, WK
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(03)
: 291
-
+
[5]
ELDRIDGE JM, 1968, T METALL SOC AIME, V242, P539
[6]
ELHOSHY AH, 1970, J ELECTROCHEM SOC, V117, P158
[7]
ESCH RP, 1969, 95 EL SOC M DETR PAP
[8]
CHEMICAL VAPOR-DEPOSITION OF PHOSPHOSILICATE GLASSES FROM MIXTURES OF SIH4, O2, AND POCI3
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
GHEZZO, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(10)
: 1428
-
&
[9]
ARSENIC GLASS SOURCE DIFFUSION IN SI AND SIO2
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GHEZZO, M
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
BROWN, DM
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(01)
: 110
-
116
[10]
STUDY OF DISSOLUTION OF SIO2 IN ACIDIC FLUORIDE SOLUTIONS
JUDGE, JS
论文数:
0
引用数:
0
h-index:
0
JUDGE, JS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(11)
: 1772
-
&
←
1
2
3
→
共 30 条
[1]
STRUCTUAL CHANGES OF ARSENIC SILICATE GLASSES WITH HEAT TREATMENTS
ARAI, E
论文数:
0
引用数:
0
h-index:
0
ARAI, E
TERUNUMA, Y
论文数:
0
引用数:
0
h-index:
0
TERUNUMA, Y
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS,
1970,
9
(06)
: 691
-
+
[2]
GLASS SOURCE B DIFFUSION IN SI AND SIO2
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
BROWN, DM
KENNICOTT, PR
论文数:
0
引用数:
0
h-index:
0
KENNICOTT, PR
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(02)
: 293
-
+
[3]
BUSEN KM, 1968, ELECTROCHEM TECHNOL, V6, P256
[4]
ELLIPSOMETRIC INVESTIGATIONS OF BORON-RICH LAYERS ON SILICON
BUSEN, KM
论文数:
0
引用数:
0
h-index:
0
BUSEN, KM
FITZGIBBONS, WA
论文数:
0
引用数:
0
h-index:
0
FITZGIBBONS, WA
TSANG, WK
论文数:
0
引用数:
0
h-index:
0
TSANG, WK
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1968,
115
(03)
: 291
-
+
[5]
ELDRIDGE JM, 1968, T METALL SOC AIME, V242, P539
[6]
ELHOSHY AH, 1970, J ELECTROCHEM SOC, V117, P158
[7]
ESCH RP, 1969, 95 EL SOC M DETR PAP
[8]
CHEMICAL VAPOR-DEPOSITION OF PHOSPHOSILICATE GLASSES FROM MIXTURES OF SIH4, O2, AND POCI3
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
GHEZZO, M
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1972,
119
(10)
: 1428
-
&
[9]
ARSENIC GLASS SOURCE DIFFUSION IN SI AND SIO2
GHEZZO, M
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GHEZZO, M
BROWN, DM
论文数:
0
引用数:
0
h-index:
0
机构:
GE,CORP RES & DEV,SCHENECTADY,NY 12301
GE,CORP RES & DEV,SCHENECTADY,NY 12301
BROWN, DM
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1973,
120
(01)
: 110
-
116
[10]
STUDY OF DISSOLUTION OF SIO2 IN ACIDIC FLUORIDE SOLUTIONS
JUDGE, JS
论文数:
0
引用数:
0
h-index:
0
JUDGE, JS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1971,
118
(11)
: 1772
-
&
←
1
2
3
→