TEMPERATURE-DEPENDENCE OF MOSFET SUBSTRATE CURRENT

被引:22
作者
HUANG, JH
ZHANG, GB
LIU, ZH
DUSTER, J
WANN, SJ
KO, P
HU, CM
机构
[1] Univ of California, Berkeley, CA
关键词
D O I
10.1109/55.215189
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Hitherto, theoretical models for MOSFET substrate current predicted that substrate current is a strong function of temperature. However, experimental data presented in this and previous studies show that the ratio of substrate current to drain current is insensitive to temperature over the range 77 to 300 K. We propose a modified model for an electron mean-free path (MFP) in the substrate current based on the concept of energy relaxation. The difference between the energy and momentum relaxation MPF is clarified and the substrate current model with modified MFP can explain the temperature dependence of the substrate current.
引用
收藏
页码:268 / 271
页数:4
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