DIFFRACTION AND X-RAY REFLECTION AT GRAZING-INCIDENCE - POSSIBILITIES OF STUDYING MULTILAYER THIN-FILM STRUCTURES

被引：7

作者：

GOLOVIN, AL

IMAMOV, RM

MELIKYAN, OG

机构：

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1989年 / 22卷

关键词：

D O I：

10.1107/S0021889889003882

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：406 / 409

页数：4

共 10 条

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[8] X-RAY TOTAL-EXTERNAL-REFLECTION-BRAGG DIFFRACTION - STRUCTURAL STUDY OF THE GAAS-AL INTERFACE [J].

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