A NUMERICAL-ANALYSIS FOR THE SMALL-SIGNAL RESPONSE OF THE MOS CAPACITOR

被引:6
作者
GAITAN, M
MAYERGOYZ, ID
机构
[1] UNIV MARYLAND,DEPT ELECT ENGN,COLLEGE PK,MD 20742
[2] INST ADV COMP STUDIES,COLLEGE PK,MD
关键词
D O I
10.1016/0038-1101(89)90093-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:207 / 213
页数:7
相关论文
共 20 条
[11]   USING MIS CAPACITOR FOR DOPING PROFILE MEASUREMENTS WITH MINIMAL INTERFACE STATE ERROR [J].
NICOLLIAN, EH ;
HANES, MH ;
BREWS, JR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (04) :380-389
[12]  
NICOLLIAN EH, 1982, MOS PHYSICS TECHNOLO
[13]   ANALYSIS OF MOSFET CAPACITANCES AND THEIR BEHAVIOR AT SHORT-CHANNEL LENGTHS USING AN AC DEVICE SIMULATOR [J].
OHKURA, Y ;
TOYABE, T ;
MASUDA, H .
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1987, 6 (03) :423-430
[14]   2-DIMENSIONAL NUMERICAL FET MODEL FOR DC, AC, AND LARGE-SIGNAL ANALYSIS [J].
REISER, M .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1973, ED20 (01) :35-45
[15]   EXACT ANALYTICAL SOLUTION OF HIGH FREQUENCY LOSSLESS MOS CAPACITANCE-VOLTAGE CHARACTERISTICS AND VALIDITY OF CHARGE ANALYSIS [J].
SAH, CT ;
PIERRET, RF ;
TOLE, AB .
SOLID-STATE ELECTRONICS, 1969, 12 (09) :681-+
[16]   LARGE-SIGNAL ANALYSIS OF A SILICON READ DIODE OSCILLATOR [J].
SCHARFETTER, DL ;
GUMMEL, HK .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1969, ED16 (01) :64-+
[17]  
Selberherr S., 1984, ANAL SIMULATION SEMI, P127, DOI DOI 10.1007/978-3-7091-8752-4_5
[18]   STATISTICS OF THE RECOMBINATIONS OF HOLES AND ELECTRONS [J].
SHOCKLEY, W ;
READ, WT .
PHYSICAL REVIEW, 1952, 87 (05) :835-842
[19]   EXACT FREQUENCY-DEPENDENT COMPLEX ADMITTANCE OF MOS DIODE INCLUDING SURFACE STATES, SHOCKLEY-READ-HALL (SRH) IMPURITY EFFECTS, AND LOW-TEMPERATURE DOPANT IMPURITY RESPONSE [J].
TEMPLE, V ;
SHEWCHUN, J .
SOLID-STATE ELECTRONICS, 1973, 16 (01) :93-113
[20]   CHARGE-ORIENTED MODEL FOR MOS-TRANSISTOR CAPACITANCES [J].
WARD, DE ;
DUTTON, RW .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1978, 13 (05) :703-708